公开(公告)号：US11209471B2

公开(公告)日：2021-12-28

申请号：US16863595

申请日：2020-04-30

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Gen Tokumoto ,  Yasuaki Komatsu

IPC: G01R35/00 ,  G01R27/28 ,  G01R27/02 ,  G01R27/26 ,  G01R31/319

Abstract: A measurement system and a method of removing effects of instability of the measurement system while measuring at least one S-parameter of a device under test (DUT) are provided. The method includes initially determining a characteristic of the measurement system, including identifying a location of an instability in the time domain of the measurement system; determining a change of the characteristic of the measurement system while connected to the DUT; and compensating for the determined change of the characteristic of the measurement system while connected to the DUT by removing effects of the determined change on measurements of the at least one S-parameter of the DUT.

公开(公告)号：US20210341526A1

公开(公告)日：2021-11-04

申请号：US16863595

申请日：2020-04-30

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Gen Tokumoto ,  Yasuaki Komatsu

IPC: G01R27/28 ,  G01R35/00

Abstract: A measurement system and a method of removing effects of instability of the measurement system while measuring at least one S-parameter of a device under test (DUT) are provided. The method includes initially determining a characteristic of the measurement system, including identifying a location of an instability in the time domain of the measurement system; determining a change of the characteristic of the measurement system while connected to the DUT; and compensating for the determined change of the characteristic of the measurement system while connected to the DUT by removing effects of the determined change on measurements of the at least one S-parameter of the DUT.