公开(公告)号：US10042029B2

公开(公告)日：2018-08-07

申请号：US13863721

申请日：2013-04-16

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Johan Ericsson

IPC: G01S7/40 ,  G01R35/00 ,  G01R27/28

Abstract: A method of calibrating a test instrument comprises determining a first response of a calibration device on the test instrument over a first set of operating ranges, determining a derived second response of the calibration device on the test instrument over a second set of operating ranges based on the first response, measuring the second response of the calibration device on the test instrument over the second set of operating ranges, and determining correction factors of the test instrument for the second set of operating ranges based on a comparison between the measured second response and the derived second response.