AUTOMATIC FIXTURE REMOVAL USING ONE-PORT MEASUREMENT
    1.
    发明申请
    AUTOMATIC FIXTURE REMOVAL USING ONE-PORT MEASUREMENT 有权
    使用一端口测量自动拆除

    公开(公告)号:US20150198523A1

    公开(公告)日:2015-07-16

    申请号:US14156401

    申请日:2014-01-15

    CPC classification number: G01N21/47 G01R27/32 G01R35/005

    Abstract: Scattering parameters of a test fixture having a first port and a second port are measured by providing a test instrument; outputting a one-port reflection test signal from the test instrument to the first port with the second port terminated in a reflective termination having a known reflection coefficient, and receiving at the test instrument a one-port reflection measurement signal from the first port; subjecting the one-port reflection measurement signal to first time gating to generate a first time-gated measurement signal, the first time gating using a first gating function temporally disposed about the first port; subjecting the one-port reflection measurement signal to second time gating to generate a second time-gated measurement signal, the second time gating using a second gating function temporally disposed about the termination; and deriving the scattering parameters from the first time-gated measurement signal and the second time-gated measurement signal.

    Abstract translation: 通过提供测试仪器来测量具有第一端口和第二端口的测试夹具的散射参数; 将来自所述测试仪器的单端口反射测试信号输出到所述第一端口,其中所述第二端口以具有已知反射系数的反射端接端接,并且在所述测试仪器处接收来自所述第一端口的单端口反射测量信号; 对所述单端口反射测量信号进行第一次门控以产生第一时间门控测量信号,所述第一时间门控使用临时设置在所述第一端口周围的第一选通功能; 对所述单端口反射测量信号进行第二时间选通以产生第二时间门控测量信号,所述第二时间选通使用临时设置在所述终端周围的第二选通功能; 并从第一时间门控测量信号和第二时间门控测量信号得出散射参数。

    Automatic fixture removal using one-port measurement
    2.
    发明授权
    Automatic fixture removal using one-port measurement 有权
    使用单端口测量自动去除夹具

    公开(公告)号:US09086376B1

    公开(公告)日:2015-07-21

    申请号:US14156401

    申请日:2014-01-15

    CPC classification number: G01N21/47 G01R27/32 G01R35/005

    Abstract: Scattering parameters of a test fixture having a first port and a second port are measured by providing a test instrument; outputting a one-port reflection test signal from the test instrument to the first port with the second port terminated in a reflective termination having a known reflection coefficient, and receiving at the test instrument a one-port reflection measurement signal from the first port; subjecting the one-port reflection measurement signal to first time gating to generate a first time-gated measurement signal, the first time gating using a first gating function temporally disposed about the first port; subjecting the one-port reflection measurement signal to second time gating to generate a second time-gated measurement signal, the second time gating using a second gating function temporally disposed about the termination; and deriving the scattering parameters from the first time-gated measurement signal and the second time-gated measurement signal.

    Abstract translation: 通过提供测试仪器来测量具有第一端口和第二端口的测试夹具的散射参数; 将来自所述测试仪器的单端口反射测试信号输出到所述第一端口,其中所述第二端口以具有已知反射系数的反射端接端接,并且在所述测试仪器处接收来自所述第一端口的单端口反射测量信号; 对所述单端口反射测量信号进行第一次门控以产生第一时间门控测量信号,所述第一时间门控使用临时设置在所述第一端口周围的第一选通功能; 对所述单端口反射测量信号进行第二时间选通以产生第二时间门控测量信号,所述第二时间选通使用临时设置在所述终端周围的第二选通功能; 并从第一时间门控测量信号和第二时间门控测量信号得出散射参数。

Patent Agency Ranking