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公开(公告)号:US20240159865A1
公开(公告)日:2024-05-16
申请号:US18244151
申请日:2023-09-08
Applicant: Keysight Technologies, Inc.
Inventor: Zhu Wen , Xiong Bin Liao , Li Cao , Zi Quan Bai , Sheng Qi Zhang
CPC classification number: G01S7/4008 , G01R29/10
Abstract: A system is provided for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT). The system includes multiple antenna elements arranged in an array, where the antenna elements include antennas and diodes coupled to the antennas, respectively. Each antenna has a radar cross-section (RCS) that is too small for the antenna elements to operate in a reflect mode. Each diode is zero biased, such that the diodes receive the incident RF signal through the antennas to which the diodes are respectively coupled, and rectify the incident RF signal to DC voltages that are proportional to power of the incident RF signal, enabling the antenna elements to operate in a detect mode.