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公开(公告)号：US12130318B2
公开(公告)日：2024-10-29
申请号：US17985911
申请日：2022-11-14
申请人： TMY Technology Inc.
发明人： Su-Wei Chang
IPC分类号： G01R29/10
CPC分类号： G01R29/10
摘要： A testing base includes a housing, a carrier, a wave absorber, and a filler. The housing has an inner surface. The carrier is disposed on the housing. The carrier includes an upper surface, a lower surface, and a groove recessed in the upper surface. The groove is adapted for accommodating a component to be tested. The lower surface and the inner surface of the housing define a cavity body together. The wave absorber is disposed on the inner surface of the housing. The filler is filled in the cavity body and contacts the wave absorber and the carrier. A relative permittivity of the filler is less than or equal to 2.
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2.发明授权公开(公告)号：US12123902B2
公开(公告)日：2024-10-22
申请号：US17946832
申请日：2022-09-16
CPC分类号： G01R29/10 , H01Q1/12 , H01Q9/0407 , H05K1/0243 , H05K1/115 , H05K2201/10098
摘要： An antenna assembly for a transceiver having first antennas arranged on a circuit board, a transmitting and receiving circuit arranged on the circuit board. The first antennas are connected to the transmitting and receiving circuit. Second antennas and terminating resistors are arranged on the circuit board. Each second antenna is connected to one of the terminating resistors by means of a strip line. At least one first contact for measuring HF properties of one of the second antennas and/or at least one second contact for measuring HF properties of the terminating resistor connected to the measurement antenna is arranged on the circuit board. The strip line between the measurement antenna and the terminating resistor is disconnectable at a disconnection point, and the strip line forms, on the side of the disconnection point nearest the measurement antenna, a third contact for measuring the HF properties of the measurement antenna.
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公开(公告)号：US20240345148A1
公开(公告)日：2024-10-17
申请号：US18577425
申请日：2022-06-23
发明人： Wilhelm Schroff , Sergiy Royak
CPC分类号： G01R29/0878 , G01R29/10
摘要： A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and made of a dielectric material for coupling electromagnetic waves into the hollow conductor (1), and a contact portion (4) which is disposed on the hollow conductor end opposite the lens element (3) and which serves to decouple a measurement signal.
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公开(公告)号：US20240241164A1
公开(公告)日：2024-07-18
申请号：US18013834
申请日：2021-06-30
申请人： AMOSENSE CO.,LTD
发明人： Wonjin SEOK , Hyungil BAEK , Kyunghyun RYU , Chanwoo LEE , Jungryul KIM
CPC分类号： G01R29/10 , G01R29/0878 , G01R29/0892 , G01R35/007
摘要： Presented is a system for testing antenna performance, in which antenna performance is tested by reflecting the loss of a cable used in the antenna performance test. The presented system for testing antenna performance comprises a tester having a test port, the test port being connected, via a cable, to an antenna that communicates with a terminal to be tested, in a shield box, when a test mode is set, wherein the tester outputs a test signal to the test port, receives a response signal corresponding to the test signal via the test port, and obtains a value, as a communication performance measurement value, by adding a calibration value to a reception signal strength of the response signal.
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公开(公告)号：US12000877B2
公开(公告)日：2024-06-04
申请号：US18173290
申请日：2023-02-23
发明人： David A. Anderson , Georg Raithel
CPC分类号： G01R29/0885 , G01R29/0892 , G01R29/10
摘要： A method for atom-based closed-loop control includes exciting atoms of a gas into one or more Rydberg states, applying one or more signal processing functions to the one or more Rydberg states, and regulating a characteristic of the applied one or more signal processing functions based on, at least in part, a response of the one or more Rydberg states to the one or more signal processing functions. A system for internal quantum-state-space interferometry includes an atomic receiver, an interferometric pathway, and a detector. The interferometer includes an atomic vapor with first atomic states and second atomic states. The interferometric pathway from RF phases between the first and second atomic states is closed by a quantum-state-space. The detector is configured to detect a readout of an interferometric signal. Embodiments include atom-based automatic level control, baseband processors, phase-locked loops, voltage transducers, raster RF imagers and waveform analyzers.
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公开(公告)号：US11916302B2
公开(公告)日：2024-02-27
申请号：US17541175
申请日：2021-12-02
申请人： Tektronix, Inc.
发明人： Donald J. Dalebroux , Amr Haj-Omar
CPC分类号： H01Q3/34 , G01R29/0892 , H01Q3/267 , G01R29/10
摘要： A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array. A method of testing a device under test using a phased array of antennas includes tuning the phased array to a first location at a first side of a reference array of antennas, by adjusting a phase for each antenna in the phased array, receiving a first signal from the device under test at the first location, tuning the phased array to a second location at a second side of the reference array of antennas, and receiving a second signal from the device under test at the second location. A test and measurement device includes at least two input channels, an array of at least two reference antennas, each antenna connected to one of the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive an input signal from one or more of the reference antennas, and measure the input signal from one or more of the reference antennas.
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公开(公告)号：US20240044962A1
公开(公告)日：2024-02-08
申请号：US18258800
申请日：2021-12-02
申请人： VERKOTAN OY
发明人： Pertti MÄKIKYRÖ
CPC分类号： G01R29/10 , G01R29/0892
摘要： A support structure for a device under test, (DUT), allows rotation, through a rotatable inner compartment applicable to fix, rotate and/or move the DUT. The inner compartment is manufactured of polymethacrylimide or other substantially RF-transparent material, and the inner compartment encloses, holds or attaches to the DUT, so that the inner compartment is made immobile relative to the DUT. The inner compartment is rotated by a first motor, so the DUT is placeable in a desired alignment angle between two conducted measurements requiring two different alignment angles. When measuring, the inner compartment remains in place and fixed with the DUT. A second motor is applicable for linear movement of the arrangement. A testing method for the DUT tests different temperatures by using two concentric compartments, and by feeding air having a desired temperature to the intermediate volume, and having through-holes on the wall of the inner compartment.
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8.发明公开公开(公告)号：US20240027519A1
公开(公告)日：2024-01-25
申请号：US18481760
申请日：2023-10-05
发明人： Natsuki Shiota , Hiroyuki Mineo
CPC分类号： G01R31/2863 , G01R29/10 , G01R31/2822 , G01R31/2867
摘要： An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.
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公开(公告)号：US11802904B2
公开(公告)日：2023-10-31
申请号：US17104913
申请日：2020-11-25
发明人： Natsuki Shiota , Hiroyuki Mineo
CPC分类号： G01R31/2863 , G01R29/10 , G01R31/2822 , G01R31/2867
摘要： An electronic component testing apparatus is used for testing a device under test (DUT). The electronic component testing apparatus includes: a socket unit that is electrically connected to the DUT; a first wiring board; and a tester that comprises a test head in which the first wiring board is mounted. The socket unit includes a first socket and a second socket. The second socket includes a base and a test antenna unit. The tester tests the DUT by transmitting and receiving radio waves between a device antenna unit of the DUT and the test antenna unit while the DUT is electrically connected to the first socket and the first socket is electrically connected to the test head through the second socket.
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公开(公告)号：US11802898B2
公开(公告)日：2023-10-31
申请号：US17215483
申请日：2021-03-29
发明人： Yong Li , Wenbo Wang , Mugen Peng
IPC分类号： H04B17/391 , G01R29/10 , H04L25/02 , G01R29/08
CPC分类号： G01R29/0878 , G01R29/10 , H04B17/3912 , H04L25/0212
摘要： Embodiments provide a method, apparatus and device of reconstructing non-Kronecker structured channels, applicable to communications. A weight matrix is determined for emulating link characteristics of a reconstructed channel, and includes a weight corresponding to each ray mapped to a probe antenna. In each cluster, rays mapped to each probe antenna have different weights with each other. For each cluster, a time-varying fading channel impulse response of each ray of the cluster mapped to a probe antenna is calculated using the weight matrix. The time-varying fading channel impulse response includes a transition equation for each probe antenna describing mapping of rays of the cluster to the probe antenna. A transition matrix from each probe antenna to receiving antennas of a device under test is determined. A product of the time-varying fading channel impulse response of the cluster multiplied by the transition matrix serves as a channel impulse response of the cluster.
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