SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    1.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME 有权
    半导体器件及其制造方法

    公开(公告)号:US20070155070A1

    公开(公告)日:2007-07-05

    申请号:US11620154

    申请日:2007-01-05

    IPC分类号: H01L21/84

    摘要: An image display device capable of high-resolution and smooth moving image display, equipped with TFTs in an n-type (or p-type) semiconductor layer with a high on-off ratio and a low resistance. In polysilicon crystallization by laser annealing, an n-type (or p-type) semiconductor layer with a low resistance is produced by performing the following processes in order: implanting nitrogen (N) ions into an amorphous silicon precursor semiconductor film; laser crystallization; implanting n-type (or p-type) dopant ions; and annealing for dopant activation. When fabricating TFTs, this low-resistance semiconductor layer is used to form a source and a drain. Since C, N, and O impurities decrease the mobility of the TFTs, polysilicon is used in which the contaminants concentrations meet the following conditions: carbon concentration ≦3×1019 cm−3, nitrogen concentration ≦5×1017 cm−3, and oxygen concentration ≦3×1019 cm−3.

    摘要翻译: 一种具有高分辨率和平滑运动图像显示的图像显示装置,在具有高开关比和低电阻的n型(或p型)半导体层中配备有TFT。 在通过激光退火的多晶硅结晶中,通过以下步骤进行以下工序来制造具有低电阻的n型(或p型)半导体层:将氮(N)离子注入到非晶硅前驱体半导体膜中; 激光结晶; 注入n型(或p型)掺杂剂离子; 并进行掺杂剂激活退火。 当制造TFT时,该低电阻半导体层用于形成源极和漏极。 由于C,N和O杂质降低了TFT的迁移率,所以使用多晶硅,其中污染物浓度满足以下条件:碳浓度<= 3×10 9 / >,氮浓度<= 5×10 17 cm -3,氧浓度<= 3×10 9 cm -3 -3 / 。