Abstract:
A system and method are disclosed for generating a high accuracy and low power on die reference clock. An LC clock is generated on die and a frequency divider lowers the LC clock frequency to a target reference frequency. An RCO clock is generated on die with an unknown initial frequency. The RCO clock and target reference clock are compared to determine in which direction the frequency of the RCO clock should be adjusted to move closer to the target reference frequency. A signal is sent causing a current source or capacitor in the RCO circuit to be modified. Therefore, the RCO clock frequency is adjusted. The RCO circuit is repeatedly adjusted until the RCO clock frequency is sufficiently accurate. The LC clock is disabled to conserve the power that would have been consumed in generating the LC clock.
Abstract:
A system and method are disclosed for generating a high accuracy and low power on die reference clock. An LC clock is generated on die and a frequency divider lowers the LC clock frequency to a target reference frequency. An RCO clock is generated on die with an unknown initial frequency. The RCO clock and target reference clock are compared to determine in which direction the frequency of the RCO clock should be adjusted to move closer to the target reference frequency. A signal is sent causing a current source or capacitor in the RCO circuit to be modified. Therefore, the RCO clock frequency is adjusted. The RCO circuit is repeatedly adjusted until the RCO clock frequency is sufficiently accurate. The LC clock is disabled to conserve the power that would have been consumed in generating the LC clock.
Abstract:
A system and method are disclosed for performing on die jitter tolerance testing. A set of clocks are generated based on an input signal. The set of clocks include in an in-phase signal based on the data switching edge of the input signal. Additionally, the set of clocks include an inverted clock phase shifted by 180 degrees, and a pair of clocks phase shifted positively and negatively by a certain number of degrees, θ. Data input is sampled based on the inverted clock and the two phase shifted clocks. The eye opening of the input signal can be determined based on whether each of the inverted clock and the two phase shifted clocks sample the correct data from the input signal at various θ values.
Abstract:
A system and method are disclosed for performing on die jitter tolerance testing. A set of clocks are generated based on an input signal. The set of clocks include in an in-phase signal based on the data switching edge of the input signal. Additionally, the set of clocks include an inverted clock phase shifted by 180 degrees, and a pair of clocks phase shifted positively and negatively by a certain number of degrees, θ. Data input is sampled based on the inverted clock and the two phase shifted clocks. The eye opening of the input signal can be determined based on whether each of the inverted clock and the two phase shifted clocks sample the correct data from the input signal at various θ values.
Abstract:
An active antenna, a base station, a method for refreshing the amplitude and phase, and a signal processing method are disclosed to simplify the structure of a phase shifter and guarantee the reliability of the phase shifter. The active antenna or the base station includes an antenna dipole array, a transceiver array, a digital processing unit (DPU), and a transceiving calibration unit. During signal reception, the transceiver demodulates a radio frequency (RF) signal of the antenna dipole into an IQ analog signal, and outputs the IQ analog signal to the DPU; the DPU converts the demodulated IQ analog signal into an IQ digital signal, and performs digital beam forming (DBF) on the IQ digital signal according to the transceiving calibration unit; during signal transmission, the transceiver modulates the IQ analog signal of the DPU into an RF signal, and outputs the RF signal to the antenna dipole; the DPU converts a signal of a base band unit (BBU) into an IQ digital signal in serial/parallel (S/P) mode, and performs DBF on the IQ digital signal according to the transceiving calibration unit.