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公开(公告)号：US20160313183A1
公开(公告)日：2016-10-27
申请号：US15104206
申请日：2014-09-17
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshitaka TERAOKA , Katsutoshi TSURUTANI , Wataru YAMAGUCHI
CPC classification number: G01J3/26 , G01J3/0221 , G01J3/0262 , G01J3/12 , G01J3/2803 , G01J3/30 , G01J3/36 , G01J2003/1234 , G01J2003/1243 , G02B5/28 , G02B26/001
Abstract: A spectroscopic unit and spectroscopic device according to the present invention are provided with a filter that is provided with a plurality of optical filter elements disposed in order from the entrance side to the exit side of light under measurement and has different transmission wavelengths corresponding to entrance positions along a first direction. A first optical filter element from among the plurality of optical filter elements is tilted with respect to a second optical filter element disposed adjacently to the first optical filter element as a result of the first optical filter element being rotated by a prescribed angle with a third direction that is perpendicular to both the first direction and s second direction from the entrance side to the exit side as the axis of rotation thereof or being rotated by a prescribed angle with the first direction as the axis of rotation thereof.
Abstract translation: 根据本发明的分光单元和分光装置设置有滤光器，该滤光器设置有从测量的光的入射侧到出射侧的顺序设置的多个滤光器元件，并且具有对应于入口位置的不同透射波长 沿着第一个方向。 多个滤光器元件中的第一滤光器元件相对于与第一滤光元件相邻设置的第二滤光元件倾斜，作为第一光学滤光元件与第三方向旋转预定角度的结果 其从第一方向和第二方向垂直于入口侧至出口侧，作为其旋转轴线，或者以第一方向旋转规定角度作为其旋转轴线。
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公开(公告)号：US20250020578A1
公开(公告)日：2025-01-16
申请号：US18762610
申请日：2024-07-02
Applicant: Konica Minolta, Inc.
Inventor： Akira KOSAKA , Satoshi MASUDA , Junichi YAMAZOE , Katsutoshi TSURUTANI
IPC: G01N21/25
Abstract: The photometric apparatus includes a light receiver having one or a plurality of light receiving sensors that receive light to be measured from an object to be measured; a controller that calculates a measured value based on an output from the one or plurality of light receiving sensors; a light attenuation member that is disposed so as to be insertable in and removable from a light path of the light to be measured and attenuates the light to be incident on the light receiver; and a corrector that corrects a difference between a measured value calculated by the controller in a state in which the light attenuation member is inserted in the light path and a measured value calculated by the controller in a state in which the light attenuation member is not inserted in the light path, the measured values varying depending on a characteristic of the object.
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Patent Agency Ranking
公开(公告)号：US20220357199A1
公开(公告)日：2022-11-10
申请号：US17620978
申请日：2020-06-26
Applicant: Konica Minolta, Inc.
Inventor： Katsutoshi TSURUTANI
Abstract: A spectrometer includes: a diffraction means that diffracts light being measured which has entered via an entrance unit; a main sensor that receives the light being measured which has been diffracted by the diffraction means; at least one auxiliary sensor disposed in an optical path of a luminous flux that does not reach the main sensor among luminous fluxes that have entered via the entrance unit, the auxiliary sensor receiving the luminous flux; and a correction means that corrects an output value of the main sensor on the basis of an output value of the auxiliary sensor.
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4.发明申请公开(公告)号：US20150323446A1
公开(公告)日：2015-11-12
申请号：US14648577
申请日：2013-11-19
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiyuki NAGASHIMA , Katsutoshi TSURUTANI
CPC classification number: G01N21/21 , G01N21/251 , G01N33/32 , G01N2201/063
Abstract: A reflection property measuring device comprising illumination light and reflected light polarizing plates held by a holder in a mutually superposed state in a thickness direction thereof, wherein the holder has a fittingly-holding portion for setting a held posture, and each of the polarizing plates has a fitting portion fittable to the fittingly-holding portion. The fitting portions of the polarizing plates are provided at positions allowing the polarizing plates to be held by the holder in respective postures where polarizing directions thereof intersect orthogonally. A manufacturing method is disclosed for polarizing plates used in the device, wherein the illumination light and reflected light polarizing plates are manufactured in such a manner as to be punched out from the same polarizing plate material.
Abstract translation: 一种反射特性测量装置，包括照明光和由保持器沿其厚度方向彼此重叠的状态保持的反射光偏振片，其中，所述保持器具有用于设定保持姿势的配合保持部，并且每个所述偏振片具有 可配合保持部分的装配部分。 偏振片的嵌合部设置在允许偏振片由其保持器保持的位置，其各个姿态的偏振方向正交。 公开了用于该装置中的偏振片的制造方法，其中照射光和反射光偏振片以从相同的偏振片材料冲压出来的方式制造。
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公开(公告)号：US20250020513A1
公开(公告)日：2025-01-16
申请号：US18762221
申请日：2024-07-02
Applicant: Konica Minolta, Inc.
Inventor： Katsutoshi TSURUTANI
Abstract: A photometric apparatus includes: a splitting optical system that splits light to be measured from an object to be measured into a plurality of light rays; a colorimetric optical system having a wavelength-selective filter on which the light that is to be measured and has been split by the splitting optical system is incident, and a light receiving sensor that receives the light that is to be measured and has been transmitted through the wavelength-selective filter; and a light attenuation member that is insertable in and removable from a light path of the light to be measured, in which the light attenuation member is disposed in front of the splitting optical system.
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公开(公告)号：US20210285818A1
公开(公告)日：2021-09-16
申请号：US17337710
申请日：2021-06-03
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI , Hidehiko FUJII , Katsutoshi TSURUTANI
Abstract: A spectrophotometer having a light-receiving optical system that images light to be measured from a position for measurement and generates imaged light to be measured; a slit formation including a slit that causes the imaged light to be measured to pass and that generates light to be measured, which travels along a measurement optical path; a grating that diffracts the light to be measured, which travels along the measurement optical path, and generates diffracted light; a sensor that receives the diffracted light and outputs a signal representing a spectral spectrum; and an observation light source that is disposed on an optical path of zeroth light among the diffracted light and that emits observation light toward the grating at a time of observing the position for measurement.
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公开(公告)号：US20200182693A1
公开(公告)日：2020-06-11
申请号：US16616151
申请日：2018-04-24
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI , Hidehiko FUJII , Katsutoshi TSURUTANI
Abstract: Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.
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