公开(公告)号：US12236576B2

公开(公告)日：2025-02-25

申请号：US17639396

申请日：2019-10-02

Applicant: Konica Minolta, Inc.

Inventor： Akira Yahashi ,  Yoshihito Souma ,  Taizo Wakimura ,  Ryuichi Yoshida ,  Shota Ueki

IPC: G06T7/00 ,  G06T7/11 ,  G06T7/70 ,  G06T11/00

Abstract: A workpiece surface defect detection device or the like that is capable of stably detecting a small surface defect with high accuracy is provided. A plurality of images indicating a portion to be measured of a workpiece serving as a target of detection of a surface defect is obtained in a state where a bright-and-dark pattern of an illumination device is moved relative to the workpiece, and a tentative defect candidate is extracted. When among a plurality of images from which the tentative defect candidate has been extracted, the number of images including the tentative defect candidate is greater than or equal to a threshold that has been set in advance, the tentative defect candidate is determined as a defect candidate. A plurality of images including the determined defect candidate is combined to generate a composite image, and a defect is detected on the basis of the generated composite image.