公开(公告)号：US10768118B2

公开(公告)日：2020-09-08

申请号：US16616011

申请日：2018-04-06

Applicant: Konica Minolta, Inc.

Inventor： Koji Harada ,  Masato Kashihara ,  Taizo Wakimura

IPC: G01N21/88 ,  G01B11/30 ,  G06T7/00

Abstract: According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face.

公开(公告)号：US12236576B2

公开(公告)日：2025-02-25

申请号：US17639396

申请日：2019-10-02

Applicant: Konica Minolta, Inc.

Inventor： Akira Yahashi ,  Yoshihito Souma ,  Taizo Wakimura ,  Ryuichi Yoshida ,  Shota Ueki

IPC: G06T7/00 ,  G06T7/11 ,  G06T7/70 ,  G06T11/00

Abstract: A workpiece surface defect detection device or the like that is capable of stably detecting a small surface defect with high accuracy is provided. A plurality of images indicating a portion to be measured of a workpiece serving as a target of detection of a surface defect is obtained in a state where a bright-and-dark pattern of an illumination device is moved relative to the workpiece, and a tentative defect candidate is extracted. When among a plurality of images from which the tentative defect candidate has been extracted, the number of images including the tentative defect candidate is greater than or equal to a threshold that has been set in advance, the tentative defect candidate is determined as a defect candidate. A plurality of images including the determined defect candidate is combined to generate a composite image, and a defect is detected on the basis of the generated composite image.