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公开(公告)号:US20210201472A1
公开(公告)日:2021-07-01
申请号:US17128680
申请日:2020-12-21
Inventor: Hoon SOHN , Soonkyu HWANG , Hyeonjin KIM , Hyung Jin LIM
IPC: G06T7/00 , G06T7/70 , G06K9/62 , G06T7/62 , H04N5/30 , G06T11/00 , G06K9/32 , G06T7/11 , G06T5/20 , G06T5/00
Abstract: Disclosed are a method of inspecting and evaluating a coating state of a steel structure, and a system therefor. A plurality of vision images and thermal images are acquired. While acquiring the thermal images, a desired region is heated. After the thermal images and the vision images in a dynamic state are reconstructed into a time-spatial-integrated thermal image and a time-spatial-integrated vision image in a static state, respectively, an overlay image is generated by overlaying the two images. A deterioration region of a coating is detected, and coating deterioration is classified by characteristics. A size of the coating deterioration region is quantified. A thickness of the coating is inspected by analyzing thermal energy measured from the time-spatial-integrated thermal image. A coating grade is calculated by comprehensively evaluating a coating deterioration inspection result and a coating thickness inspection result. A state evaluation report for the steel structure is automatically created.
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公开(公告)号:US20200074901A1
公开(公告)日:2020-03-05
申请号:US16512990
申请日:2019-07-16
Inventor: Hoon SOHN , Sangwoo CHOI , Minsang KOO , Sanghyuk KWON , Eunchul SHIN , Woojin JUNG , Jiho PARK , Soonkyu HWANG
IPC: G09G3/00 , G01N21/956 , G01N21/17 , G01N25/72
Abstract: An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.
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