Microscope system and method for examining a sample

    公开(公告)号:US12105272B2

    公开(公告)日:2024-10-01

    申请号:US17291283

    申请日:2019-11-12

    发明人: Jan Braun

    IPC分类号: G02B21/26 G02B21/36

    CPC分类号: G02B21/26 G02B21/365

    摘要: A microscope system for examining a sample includes: a microscope having a movable microscope table, on which the sample to be examined is positionable; and a controller for: transmitting a first position signal to the microscope table, based on which the microscope table is movable into a first table position; causing the microscope, in a first examination step, to examine a first region of the sample associated with the first table position when the microscope table has been moved into the first table position; transmitting at least one second position signal to the microscope table, based on which the microscope table is movable into a second table position; and causing the microscope, in a second examination step chronologically following the first examination step, to examine a second region of the sample associated with the second table position when the microscope table has been moved into the second table position.