SINGLE-PARTICLE LOCALIZATION MICROSCOPE
    1.
    发明公开

    公开(公告)号:US20240361584A1

    公开(公告)日:2024-10-31

    申请号:US18645424

    申请日:2024-04-25

    摘要: A single-particle localization microscope includes a light source configured to generate illumination light for illuminating a sample region, and an optical illumination system configured to shape the illumination light into a localizing light distribution having a substantially zero intensity minimum at a target point within the sample region. The localizing light distribution is adapted to cause a single particle in a fluorescent state located in the sample region outside the intensity minimum to emit fluorescent light. The optical illumination system is further configured to shape the illumination light into an auxiliary light distribution having a non-zero intensity at the target point such that the auxiliary light distribution is defined in a spatial extent and/or in its shape by the localizing light distribution.