Computer-aided design system to automate scan synthesis at register-transfer level
    1.
    发明授权
    Computer-aided design system to automate scan synthesis at register-transfer level 失效
    计算机辅助设计系统,用于在寄存器传输级别自动扫描合成

    公开(公告)号:US06957403B2

    公开(公告)日:2005-10-18

    申请号:US10108238

    申请日:2002-03-28

    摘要: A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).

    摘要翻译: 一种在寄存器传输级(RTL)下自动扫描合成的方法和系统。 该方法和系统将产生在RTL建模的扫描HDL代码,用于在RTL建模的集成电路。 该方法和系统包括执行RTL可测试性分析,时钟域最小化,扫描选择,测试点选择,扫描修复和测试点插入,扫描替换和扫描拼接,扫描提取,交互式扫描调试,交互式扫描修复的计算机实现步骤 和冲洗/随机测试台生成。 此外,本发明还包括通过逐个模块执行扫描合成然后将这些扫描的模块拼接在一起的层次扫描合成的方法和系统。 本发明还包括将扫描HDL码与其他测试(DFT)HDL码进行集成和验证,包括边界扫描和逻辑BIST(内置自检)。