METHOD AND APPARATUS FOR MEASURING LINEAR DISPLACMENT
    1.
    发明申请
    METHOD AND APPARATUS FOR MEASURING LINEAR DISPLACMENT 有权
    测量线性位移的方法和装置

    公开(公告)号:US20130113468A1

    公开(公告)日:2013-05-09

    申请号:US13809398

    申请日:2010-07-23

    IPC分类号: G01B7/14 E21B49/08

    摘要: For some embodiments, a system includes a moveable structure, moveable in at least a linear direction relative to a supporting structure, a magnetic field sensor assembly including a magnetic field sensor, and a magnet, wherein one of the magnet and the magnetic field sensor is coupled to the moveable structure, and wherein the other of the magnet and the magnetic field sensor assembly is coupled to the supporting structure, and wherein the magnetic field sensor assembly is configured to determine the relative position of the magnet to the magnetic field sensor.

    摘要翻译: 对于一些实施例,系统包括可相对于支撑结构在至少一个线性方向上移动的可移动结构,包括磁场传感器的磁场传感器组件和磁体,其中磁体和磁场传感器之一是 耦合到所述可移动结构,并且其中所述磁体和所述磁场传感器组件中的另一个耦合到所述支撑结构,并且其中所述磁场传感器组件被配置为确定所述磁体与所述磁场传感器的相对位置。