摘要:
In a method of opto-electronic inspection of a two-dimensional pattern on an object, especially a printed board, a micro-inspection is carried out by subjecting line-by-line scanned picture elements in pixel-by-pixel fashion to a sequence of picture operations for inspection of dimensions and spacings, and the respective result is compared with the corresponding scanned pixel. At the same time a macro-inspection is carried out by combining the scanned pixels to frames and by respective reduction thereof to a single characteristic picture information, whereupon a comparison is again performed, but this time with the corresponding picture information of a reference picture. In this way it is possible to perform a quick and fully automatic real-time inspection of two-dimensional patterns, for instance printed boards, both for minute and hardly visible defects and for macro-defects.
摘要:
A method for representing a composite image on a screen of a screen device, the image being composed of a plurality of natural and/or synthetic sub-images generated by diferent sources, is characterized in that the sub-images are composed of a line-by-line representation on the screen by (a) reading out at video rate a pluralaity of pixels, the number of which corresponds to that of the respective sub-image from said storages line by line and (b) repeating step (a) line by line. Furthermore, there is set forth a device for carrying out the method according to the invention.