公开(公告)号：US20250054130A1

公开(公告)日：2025-02-13

申请号：US18798858

申请日：2024-08-09

Applicant: MEDIATEK INC.

Inventor： En Jen ,  Shao-Yun Liu ,  Yi-Ju Ting ,  Chin-Tang Lai ,  Chia-Shun Yeh ,  Ching-Yu Lin ,  Ching-Han Jan ,  Po-Hsuan Huang

IPC: G06T7/00 ,  G06V10/762

Abstract: A wafer map recognition method using artificial intelligence includes obtaining wafer maps of a plurality of wafers; performing an unsupervised algorithm on the wafer map of each wafer in the plurality of wafers to generate a feature data set for the corresponding wafer map; and performing a clustering algorithm according to a plurality of feature data sets for the plurality of wafer maps to find a wafer map with a potential defect.

公开(公告)号：US12124548B2

公开(公告)日：2024-10-22

申请号：US17675266

申请日：2022-02-18

Applicant: MEDIATEK INC.

Inventor： Hung-Chih Chiu ,  En Jen

IPC: G06F21/32 ,  G06N3/045

CPC classification number: G06F21/32 ,  G06N3/045

Abstract: An authentication system for authenticating an identification of a subject is provided. The authentication system includes a photoplethysmogram (PPG) sensor, a storage device, and a processor. The PPG sensor is configured to sense pulses of a blood vessel of the subject to generate a sensed PPG signal of the subject. The storage device stores an authentication model. The processor is configured to load the authentication model from the storage device and input the sensed PPG signal and a reference PPG signal into the authentication model to generate a result value which indicates whether the identification of the subject passes an authentication test.