公开(公告)号：US11592572B2

公开(公告)日：2023-02-28

申请号：US17146289

申请日：2021-01-11

Applicant: Meta Platforms Technologies, LLC

Inventor： Niv Kantor ,  Nadav Grossinger ,  Nitay Romano

IPC: G01S17/89 ,  G01S7/481 ,  H04N5/225

Abstract: In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.

公开(公告)号：US11941830B2

公开(公告)日：2024-03-26

申请号：US17496021

申请日：2021-10-07

Applicant: META PLATFORMS TECHNOLOGIES, LLC

Inventor： Niv Kantor ,  Ricardo Garcia ,  Nadav Grossinger ,  Robert Hasbun ,  Nitay Romano

IPC: G06T7/521 ,  G01S17/48

CPC classification number: G06T7/521 ,  G01S17/48 ,  G06T2207/10028

Abstract: In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns during the time period, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the projector.