公开(公告)号：US20160098909A1

公开(公告)日：2016-04-07

申请号：US14967930

申请日：2015-12-14

Applicant: Microchip Technology Incorporated

Inventor： Joseph Julicher ,  Keith Curtis ,  Paul N. Katz

IPC: G08B17/113

CPC classification number: G08B17/11 ,  G01N27/66 ,  G08B17/113

Abstract: An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.

Abstract translation: 离子室提供代表其受外部条件（例如清洁空气或烟雾）影响的其特性的电流。 直流（DC）电压以第一极性施加到离子室，并且通过离子室产生的电流和寄生漏电流以第一极性被测量，然后将直流电压以第二极性施加到离子室 与第一极性相反，并且在第二极性处测量通过离子室的所得电流和寄生漏电流。 由于基本上没有电流以第二极性流过离子室，所以可以从总电流测量中去除从第一极性测得的电流以第二极性测量的电流来消除共模寄生漏电流贡献，从而产生正好 电流通过离子室。

公开(公告)号：US20130088238A1

公开(公告)日：2013-04-11

申请号：US13633686

申请日：2012-10-02

Applicant: MICROCHIP TECHNOLOGY INCORPORATED

Inventor： Joseph Julicher ,  Keith Curtis ,  Paul N. Katz

IPC: G01N27/66

CPC classification number: G08B17/11 ,  G01N27/66 ,  G08B17/113

Abstract: An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.

Abstract translation: 离子室提供代表其受外部条件（例如清洁空气或烟雾）影响的其特性的电流。 直流（DC）电压以第一极性施加到离子室，并且通过离子室产生的电流和寄生漏电流以第一极性被测量，然后将直流电压以第二极性施加到离子室 与第一极性相反，并且在第二极性处测量通过离子室的所得电流和寄生漏电流。 由于基本上没有电流以第二极性流过离子室，所以可以从总电流测量中去除从第一极性测得的电流以第二极性测量的电流来消除共模寄生漏电流贡献，从而产生正好 电流通过离子室。

公开(公告)号：US09805572B2

公开(公告)日：2017-10-31

申请号：US14967930

申请日：2015-12-14

Applicant: Microchip Technology Incorporated

Inventor： Joseph Julicher ,  Keith Curtis ,  Paul N. Katz

IPC: H01T13/00 ,  G08B17/11 ,  G01N27/66 ,  G08B17/113

CPC classification number: G08B17/11 ,  G01N27/66 ,  G08B17/113

Abstract: An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.

公开(公告)号：US09437093B2

公开(公告)日：2016-09-06

申请号：US13633686

申请日：2012-10-02

Applicant: Microchip Technology Incorporated

Inventor： Joseph Julicher ,  Keith Curtis ,  Paul N. Katz

IPC: G01N27/66 ,  G08B17/11

CPC classification number: G08B17/11 ,  G01N27/66 ,  G08B17/113

Abstract: An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.

Abstract translation: 离子室提供代表其受外部条件（例如清洁空气或烟雾）影响的其特性的电流。 直流（DC）电压以第一极性施加到离子室，并且通过离子室产生的电流和寄生漏电流以第一极性被测量，然后将直流电压以第二极性施加到离子室 与第一极性相反，并且在第二极性处测量通过离子室的所得电流和寄生漏电流。 由于基本上没有电流以第二极性流过离子室，所以可以从总电流测量中去除从第一极性测得的电流以第二极性测量的电流来消除共模寄生漏电流贡献，从而产生正好 电流通过离子室。