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公开(公告)号:US11205479B2
公开(公告)日:2021-12-21
申请号:US15931080
申请日:2020-05-13
Applicant: MICRON TECHNOLOGY, INC.
Inventor: John Fredric Schreck , Hari Giduturi
IPC: G11C13/00
Abstract: An architecture of the memory device may leverage a transmission path resistance compensation scheme for memory cells to reduce the effect of parasitic loads in accessing a memory cell. A memory cell of such a memory device may experience a total resistance including a transmission path resistance associated with the respective access lines of the memory cell and an added compensatory resistance. The foregoing memory device may leverage a spike mitigation scheme to mitigate the harmful effect of a voltage and/or rush current to the near memory cells of the memory device. In addition, spike mitigation circuitry may include coupling a resistor on access lines near the respective decoders. Further, spike mitigation circuitry may include coupling a resistor between the decoders.
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公开(公告)号:US11749342B2
公开(公告)日:2023-09-05
申请号:US17549390
申请日:2021-12-13
Applicant: Micron Technology, Inc.
Inventor: John Fredric Schreck , Hari Giduturi
IPC: G11C13/00
CPC classification number: G11C13/0026 , G11C13/0028
Abstract: An architecture of the memory device may leverage a transmission path resistance compensation scheme for memory cells to reduce the effect of parasitic loads in accessing a memory cell. A memory cell of such a memory device may experience a total resistance including a transmission path resistance associated with the respective access lines of the memory cell and an added compensatory resistance. The foregoing memory device may leverage a spike mitigation scheme to mitigate the harmful effect of a voltage and/or rush current to the near memory cells of the memory device. In addition, spike mitigation circuitry may include coupling a resistor on access lines near the respective decoders. Further, spike mitigation circuitry may include coupling a resistor between the decoders.
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公开(公告)号:US20220101918A1
公开(公告)日:2022-03-31
申请号:US17549390
申请日:2021-12-13
Applicant: Micron Technology, Inc.
Inventor: John Fredric Schreck , Hari Giduturi
IPC: G11C13/00
Abstract: An architecture of the memory device may leverage a transmission path resistance compensation scheme for memory cells to reduce the effect of parasitic loads in accessing a memory cell. A memory cell of such a memory device may experience a total resistance including a transmission path resistance associated with the respective access lines of the memory cell and an added compensatory resistance. The foregoing memory device may leverage a spike mitigation scheme to mitigate the harmful effect of a voltage and/or rush current to the near memory cells of the memory device. In addition, spike mitigation circuitry may include coupling a resistor on access lines near the respective decoders. Further, spike mitigation circuitry may include coupling a resistor between the decoders.
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公开(公告)号:US20210358545A1
公开(公告)日:2021-11-18
申请号:US15931080
申请日:2020-05-13
Applicant: MICRON TECHNOLOGY, INC.
Inventor: John Fredric Schreck , Hari Giduturi
IPC: G11C13/00
Abstract: An architecture of the memory device may leverage a transmission path resistance compensation scheme for memory cells to reduce the effect of parasitic loads in accessing a memory cell. A memory cell of such a memory device may experience a total resistance including a transmission path resistance associated with the respective access lines of the memory cell and an added compensatory resistance. The foregoing memory device may leverage a spike mitigation scheme to mitigate the harmful effect of a voltage and/or rush current to the near memory cells of the memory device. In addition, spike mitigation circuitry may include coupling a resistor on access lines near the respective decoders. Further, spike mitigation circuitry may include coupling a resistor between the decoders.
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