公开(公告)号：US20240427500A1

公开(公告)日：2024-12-26

申请号：US18733350

申请日：2024-06-04

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Nicola Ciocchini ,  Thomas Lentz ,  Ugo Russo

IPC: G06F3/06 ,  G11C16/04 ,  G11C16/08 ,  G11C16/26

Abstract: A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a read operation on a set of memory cells of the memory device; identifying a wordline group coupled to the set of memory cells of the memory device; identifying a threshold voltage offset bin associated with the set of memory cells; determining a current temperature associated with the set of memory cells; determining, based on the threshold voltage offset bin and the current temperature, a read mask identifier associated with the set of memory cells; determining, based on the read mask identifier and the wordline group, a set of threshold voltage offsets associated with the set of memory cells; and performing the read operation using the set of threshold voltage offsets.

公开(公告)号：US12287982B2

公开(公告)日：2025-04-29

申请号：US17953182

申请日：2022-09-26

Applicant: Micron Technology, Inc.

Inventor： Vamsi Pavan Rayaprolu ,  Thomas Lentz

IPC: G06F3/06

Abstract: A system includes a memory device containing multiple dies that each have multiple pages, and a processing device, operatively coupled with the memory device, to perform various operations including scanning a group of pages residing on a die and determining a value of one data state metric and a corresponding value of another state metric. The operations can also include recording a set of values of the first metric and a corresponding set of values of the second metric, as well as calculating the value of the second metric corresponding to a predetermined value of the first metric associated with a failure condition of the die. Additionally, the operations can include identifying a particular criterion that is satisfied by the calculated value, assigning, to the die, a rating corresponding to the identified criterion, and performing scans on the die at a frequency determined by the assigned rating.

公开(公告)号：US20240069785A1

公开(公告)日：2024-02-29

申请号：US17953182

申请日：2022-09-26

Applicant: Micron Technology, Inc.

Inventor： Vamsi Pavan Rayaprolu ,  Thomas Lentz

IPC: G06F3/06

CPC classification number: G06F3/0653 ,  G06F3/0604 ,  G06F3/0644 ,  G06F3/0679

Abstract: A system includes a memory device containing multiple dies that each have multiple pages, and a processing device, operatively coupled with the memory device, to perform various operations including scanning a group of pages residing on a die and determining a value of one data state metric and a corresponding value of another state metric. The operations can also include recording a set of values of the first metric and a corresponding set of values of the second metric, as well as calculating the value of the second metric corresponding to a predetermined value of the first metric associated with a failure condition of the die. Additionally, the operations can include identifying a particular criterion that is satisfied by the calculated value, assigning, to the die, a rating corresponding to the identified criterion, and performing scans on the die at a frequency determined by the assigned rating.