公开(公告)号：US20250035431A1

公开(公告)日：2025-01-30

申请号：US18758861

申请日：2024-06-28

Applicant: MITUTOYO CORPORATION

Inventor： Ryosuke TANAKA ,  Hikaru SHIGENO ,  Yuji SADAHIRA

IPC: G01B11/25

Abstract: A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part about a first axis; a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis; and a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.