公开(公告)号：US20250035430A1

公开(公告)日：2025-01-30

申请号：US18758580

申请日：2024-06-28

Applicant: MITUTOYO CORPORATION

Inventor： Ryosuke TANAKA ,  Yuji SADAHIRA ,  Takeshi SAEKI

IPC: G01B11/25 ,  G06K7/14

Abstract: A calibration jig which calibrates a measurement apparatus that measures a three-dimensional geometry of a measurement target and includes a plurality of imaging parts that capture the measurement target, the calibration jig including: a plurality of elements to be measured; and a frame part to which the plurality of elements to be measured are attached, wherein each of the plurality of elements to be measured includes a main body part having a predetermined shape; and a plurality of label parts provided on the main body part, wherein an identification code for identifying the elements to be measured is shown on each label part.

公开(公告)号：US20250035431A1

公开(公告)日：2025-01-30

申请号：US18758861

申请日：2024-06-28

Applicant: MITUTOYO CORPORATION

Inventor： Ryosuke TANAKA ,  Hikaru SHIGENO ,  Yuji SADAHIRA

IPC: G01B11/25

Abstract: A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part about a first axis; a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis; and a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.

公开(公告)号：US20240282004A1

公开(公告)日：2024-08-22

申请号：US18435347

申请日：2024-02-07

Applicant: MITUTOYO CORPORATION

Inventor： Ryosuke TANAKA

IPC: G06T7/80 ,  H04N23/695

CPC classification number: G06T7/80 ,  H04N23/695

Abstract: A calibration method including: a first imaging step of imaging a calibration jig, a second imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined first direction, a third imaging step of imaging the calibration jig after causing the calibration jig to be moved in a predetermined second direction, a fourth imaging step of imaging the calibration jig, a fifth imaging step of imaging the calibration jig after rotating the calibration jig about an axis oriented in a predetermined third direction, a sixth imaging step of imaging the calibration jig after rotating the calibration jig about an axis oriented in a predetermined fourth direction, and identifying calibration parameters used for calibration of the measurement apparatus.