公开(公告)号：US20150323308A1

公开(公告)日：2015-11-12

申请号：US14700514

申请日：2015-04-30

Applicant: MITUTOYO CORPORATION

Inventor： Masaharu TSUJII ,  Satoko MORI

IPC: G01B11/00

CPC classification number: G01B11/005 ,  G01B5/004 ,  G01B11/002

Abstract: A coordinate measuring system includes a probe provided with first to ninth infrared LEDs, and an image capture apparatus and calculation controller detecting the position of the probe. The probe includes a distance obtainer acquiring distance data for a distance from the probe to the image capture apparatus; and an illumination controller controlling an illumination time of the first to ninth infrared LEDs based on the distance represented by the distance data.

Abstract translation: 坐标测量系统包括设置有第一至第九红外LED的探针，以及检测探头位置的图像捕获装置和计算控制器。 探头包括距离获取器获取距离探头到图像捕获设备一定距离的距离数据; 以及基于由所述距离数据表示的距离来控制所述第一至第九红外LED的照明时间的照明控制器。

公开(公告)号：US20140250989A1

公开(公告)日：2014-09-11

申请号：US14193403

申请日：2014-02-28

Applicant: MITUTOYO CORPORATION

Inventor： Masaharu TSUJII ,  Satoko MORI

IPC: G01N3/42

CPC classification number: G01N3/42 ,  G01N2203/0078 ,  G01N2203/0222

Abstract: A hardness tester has a test force applier generating a test force using an electromagnetic force generated by supplying a current to a drive coil provided in a magnetic field and applies the test force to an indenter to press the indenter into a surface of a sample; a temperature detector detecting a temperature of the test force applier; and a test force corrector correcting the test force generated from the test force applier based on the temperature detected by the temperature detector.

Abstract translation: 硬度计具有试压力施加器，其使用通过向设置在磁场中的驱动线圈提供电流而产生的电磁力产生测试力，并将测试力施加到压头以将压头压入样品表面; 检测试压装置的温度的温度检测器; 以及测试力校正器，其基于由温度检测器检测到的温度来校正由测试力施加器产生的测试力。

公开(公告)号：US20180217040A1

公开(公告)日：2018-08-02

申请号：US15869384

申请日：2018-01-12

Applicant: MITUTOYO CORPORATION

Inventor： Masaharu TSUJII ,  Satoko MORI ,  Takayuki YAMADA

IPC: G01N3/42 ,  G01N3/62

CPC classification number: G01N3/42 ,  G01N3/62 ,  G01N2203/0082 ,  G01N2203/0208 ,  G01N2203/0605 ,  G01N2203/0676

Abstract: A hardness tester includes a measurer (CPU) measuring a value for a material characteristic of a sample in conjunction with formation of an indentation, an acquirer (CPU) acquiring measurement data associated with the value for the material characteristic of the sample measured by the measurer, and a determiner (CPU) accumulating a predetermined value for the material characteristic based on the measurement data acquired by the acquirer and determining a time to replace the indenter based on the accumulated value for the material characteristic.

公开(公告)号：US20170102305A1

公开(公告)日：2017-04-13

申请号：US15281349

申请日：2016-09-30

Applicant: MITUTOYO CORPORATION

Inventor： Masaharu TSUJII ,  Satoko MORI ,  Takayuki YAMADA

IPC: G01N3/42

CPC classification number: G01N3/42 ,  G01N2203/005 ,  G01N2203/0078 ,  G01N2203/0098

Abstract: A hardness tester loads a predetermined test force on an indenter and presses into a surface of a sample to form an indentation. The indenter includes an indenter memory storing indenter information specific to the indenter. The indenter is detachably mounted to an indenter shaft. A CPU acquires, from the indenter memory, the indenter information of the indenter mounted to the indenter shaft, and uses the acquired indenter information to perform a predetermined operation and calculate hardness.