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公开(公告)号：US11555683B2
公开(公告)日：2023-01-17
申请号：US17508106
申请日：2021-10-22
Applicant: MITUTOYO CORPORATION
Inventor： Satoshi Yoshitani , Tomoyuki Miyazaki
Abstract: A form measuring instrument includes: a contact tip configured to contact with a workpiece; a movement mechanism configured to cause relative movement of the contact tip with respect to the workpiece; a movement controlling unit configured to control the movement mechanism; a contact sensor configured to detect a contact amount of the contact tip with the workpiece and output a detection signal corresponding to the contact amount; and an abnormality determining unit configured to determine an abnormality of sensitivity of the contact sensor based on a change in the detection signal outputted from the contact sensor during an operation of the movement mechanism in which the contact tip is pressed against the workpiece.
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公开(公告)号：US10788312B2
公开(公告)日：2020-09-29
申请号：US16013467
申请日：2018-06-20
Applicant: MITUTOYO CORPORATION
Inventor： Kazuhiko Hidaka , Satoshi Yoshitani
Abstract: A coordinate measuring unit includes a measuring probe and a processing device configured to compute the shape coordinates of an object to be measured on the basis of an output of the measuring probe. The measuring probe has a first identification code. The processing device includes a first determination portion configured to determine whether the first identification code outputted from the measuring probe is matched with a matching code, and a downstream determination portion configured to identify a second identification code outputted from the measuring probe to thereby recognize the measuring probe when the first identification code is matched with the matching code in the first determination portion and the measuring probe further has the second identification code. The coordinate measuring unit with the aforementioned configuration can efficiently recognize a number of measuring probes.
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