公开(公告)号：US20250035671A1

公开(公告)日：2025-01-30

申请号：US18771127

申请日：2024-07-12

Applicant: MPI CORPORATION

Inventor： CHENG-NIEN SU ,  CHUNG-CHI LIN ,  CHING-HUA WU ,  HSIEN-TA HSU

IPC: G01R1/067 ,  G01R3/00 ,  G01R31/28

Abstract: A contacting member of a contact probe for a probe system for performing a functionality test to a DUT includes a body, a contact tip, and a tip transition section between the body and the contact tip. A bottom side of the contacting member, which faces toward the DUT when testing the DUT, includes a lower surface at the body, a tip bottom surface at the contact tip, and a tip transition surface at the tip transition section. A contact end of the contact tip for contacting the DUT is located on a front side of the tip bottom surface. A rear side of the tip bottom surface and the lower surface have a height difference therebetween. The tip transition surface gradually changes in height from the lower surface to the rear side of the tip bottom surface. The contacting member has high precision and structural strength.