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公开(公告)号：US20200011898A1
公开(公告)日：2020-01-09
申请号：US16459076
申请日：2019-07-01
Applicant: MPI CORPORATION
Inventor： Tzu Yang CHEN , Chia Ju Wei
Abstract: A probe head includes a linear probe which is flattened at at least one of tail, body and head portions thereof and thereby defined with first and second width axes, along which each of the tail, body and head portions is defined with first and second widths, and upper and lower die units having upper and lower installation holes respectively, wherein the tail and head portions are inserted respectively, which are offset from each other along the second width axis so that the body portion is curved. The first and second widths of the body portion are respectively larger and smaller than the first and second widths of at least one of the tail and head portions. As a result, the probes of the same probe head are consistent in bending direction and moving behavior and prevented from rotation, drop and escape.
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公开(公告)号：US11143674B2
公开(公告)日：2021-10-12
申请号：US16459076
申请日：2019-07-01
Applicant: MPI CORPORATION
Inventor： Tzu Yang Chen , Chia Ju Wei
Abstract: A probe head includes a linear probe which is flattened at least one of tail, body and head portions thereof and thereby defined with first and second width axes, along which each of the tail, body and head portions is defined with first and second widths, and upper and lower die units having upper and lower installation holes respectively, wherein the tail and head portions are inserted respectively, which are offset from each other along the second width axis so that the body portion is curved. The first and second widths of the body portion are respectively larger and smaller than the first and second widths of at least one of the tail and head portions. As a result, the probes of the same probe head are consistent in bending direction and moving behavior and prevented from rotation, drop and escape.
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公开(公告)号：US20200011896A1
公开(公告)日：2020-01-09
申请号：US16459155
申请日：2019-07-01
Applicant: MPI CORPORATION
Inventor： Tzu Yang Chen , Chia Ju Wei
Abstract: A probe head includes a linear probe whose tail and head portions are flattened and thereby have elongated-shaped cross sections, and upper and lower die units having upper and lower installation holes accommodating the tail and head portions respectively. First and second widths of the body portion are respectively larger and smaller than first and second widths of at least one of the tail and head portions. The lower installation hole includes a lower elongated-shaped hole and an upper circular hole with diameter larger than or equal to length of the elongated-shaped hole and larger than the first and second widths of the body portion. As a result, the probes of the same probe head are consistent in bending direction and moving behavior and prevented from self-rotation and drop. Besides, the wear of the probe and the dies is minimized, and the probe installation is convenient.
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