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公开(公告)号:US20240201875A1
公开(公告)日:2024-06-20
申请号:US18082932
申请日:2022-12-16
Applicant: Macronix International Co., Ltd.
Inventor: Shih-Chou Juan , Wei-Yan Jang
IPC: G06F3/06
CPC classification number: G06F3/0625 , G06F3/0653 , G06F3/0679
Abstract: A system includes a semiconductor device configured to store data and a controller communicatively coupled to the semiconductor device. The semiconductor device and the controller are configured to: in response to determining that particular data stored in the semiconductor device satisfies a reliability condition, obtain first readout data by reading the particular data at a first read voltage, and obtain second readout data by reading the particular data at a second read voltage. The second read voltage is different from the first read voltage. The semiconductor device and the controller are configured to compare the first readout data and the second readout data and obtain a comparison result; and, based on the comparison result, determine whether to perform an error correction process on the particular data.
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公开(公告)号:US12067267B2
公开(公告)日:2024-08-20
申请号:US18082932
申请日:2022-12-16
Applicant: Macronix International Co., Ltd.
Inventor: Shih-Chou Juan , Wei-Yan Jang
IPC: G06F3/06
CPC classification number: G06F3/0625 , G06F3/0653 , G06F3/0679
Abstract: A system includes a semiconductor device configured to store data and a controller communicatively coupled to the semiconductor device. The semiconductor device and the controller are configured to; in response to determining that particular data stored in the semiconductor device satisfies a reliability condition, obtain first readout data by reading the particular data at a first read voltage, and obtain second readout data by reading the particular data at a second read voltage. The second read voltage is different from the first read voltage. The semiconductor device and the controller are configured to compare the first readout data and the second readout data and obtain a comparison result; and, based on the comparison result, determine whether to perform an error correction process on the particular data.
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