公开(公告)号：US07317517B2

公开(公告)日：2008-01-08

申请号：US10631538

申请日：2003-07-31

申请人： Mahesh R. Junnarkar ,  Bidhan P. Chaudhuri

发明人： Mahesh R. Junnarkar ,  Bidhan P. Chaudhuri

IPC分类号： G01N21/00

CPC分类号： G01M11/35

摘要： A waveguide under test can be exposed to a light signal whose polarization rotates between the vertical and horizontal polarizations. The intensity detected at a photodetector can be separated into AC and DC components. The AC components may be utilized to derive a characteristics which is indicative of birefringence of the waveguide. If the light signal is scanned over the waveguide under test, a measure of the birefringence at each position along the waveguide may be determined.

摘要翻译： 受测试的波导可以暴露于其垂直和水平极化之间偏振旋转的光信号。 在光电检测器处检测的强度可以分为AC和DC分量。 可以使用AC分量来导出指示波导的双折射的特性。 如果光信号在被测波导上扫描，则可以确定沿着波导的每个位置处的双折射的测量。