摘要:
A method of determining whether a stack of components in a device are in a desired order includes irradiating each of the components in the device with an energy beam. The radiation emissions from each of the irradiated components are detected with a radiation detector. The detected radiation emissions are analyzed using a central processing unit (CPU) to determine whether the components in the device are stacked in the desired order.
摘要:
A method of determining whether a stack of components in a device are in a desired order includes irradiating each of the components in the device with an energy beam. The radiation emissions from each of the irradiated components are detected with a radiation detector. The detected radiation emissions are analyzed using a central processing unit (CPU) to determine whether the components in the device are stacked in the desired order.