公开(公告)号：US08248083B2

公开(公告)日：2012-08-21

申请号：US12759804

申请日：2010-04-14

申请人： Masaru Inoue ,  Osamu Okawara ,  Hideki Fuchino

发明人： Masaru Inoue ,  Osamu Okawara ,  Hideki Fuchino

IPC分类号： G01R27/26

CPC分类号： G11B5/5552

摘要： A processing device is provided with a circuit connected to a first conductive portion and a second conductive portion. An AC voltage source produces an AC waveform voltage obtained by adding a bias voltage to an AC voltage for capacitance measurement. The AC waveform voltage is applied between the first conductive portion and the second conductive portion through the measurement probes. The moment the AC waveform voltage is applied to the circuit with a switch closed, an inrush current flows through the circuit based on a potential difference of the bias voltage. This inrush current causes dielectric breakdown in the conductive resin, thereby securing the continuity of the conductive resin. With the continuity of the conductive resin secured, a capacitance of the piezoelectric body is measured by the AC waveform voltage, and it is determined whether or not the piezoelectric body is normal.

摘要翻译： 处理装置设置有连接到第一导电部分和第二导电部分的电路。 交流电压源产生通过将偏置电压加到用于电容测量的AC电压而获得的AC波形电压。 AC波形电压通过测量探针施加在第一导电部分和第二导电部分之间。 交流波形电压施加到开关闭合的电路的瞬间，浪涌电流基于偏置电压的电位差流过电路。 该浪涌电流导致导电树脂中的电介质击穿，从而确保导电树脂的连续性。 通过确保导电树脂的连续性，通过AC波形电压来测量压电体的电容，并且确定压电体是否正常。

公开(公告)号：US20130250554A1

公开(公告)日：2013-09-26

申请号：US13530551

申请日：2012-06-22

申请人： Yoko NOGUCHI ,  Tomoko Ishiwata ,  Kazunori Yashiro ,  Masaru Inoue ,  Makoto Kawagoe ,  Fumie Iwata ,  Hitoshi Kawano ,  Shigehisa Kawatsuru

发明人： Yoko NOGUCHI ,  Tomoko Ishiwata ,  Kazunori Yashiro ,  Masaru Inoue ,  Makoto Kawagoe ,  Fumie Iwata ,  Hitoshi Kawano ,  Shigehisa Kawatsuru

IPC分类号： F21S8/00 ,  F21V13/10

CPC分类号： F21V13/10 ,  F21S4/20 ,  F21S8/03 ,  F21V7/005 ,  F21V11/02

摘要： According to one embodiment, a luminaire is provided which can enhance the feeling of brightness of a space and can reduce glare. The luminaire includes an equipment mounted on a ceiling surface. The equipment includes a light source and a light control unit. When an amount of light emitted outside from the equipment is an equipment luminous flux, and a direction right under the equipment has a luminous intensity distribution angle of 0°, the light control unit controls to cause a luminous flux falling within a range of a luminous intensity distribution angle of 90° to 120° to be 20% or more of the equipment luminous flux and to cause a luminous flux falling within a range of a luminous intensity distribution angle of 60° to 90° to be 20% or less of the equipment luminous flux.

摘要翻译： 根据一个实施例，提供了可以增强空间的亮度感并可以减少眩光的照明器。 灯具包括安装在天花板表面上的设备。 该设备包括光源和光控单元。 当从设备外部发射的光量是设备光通量，并且设备正下方的光的分布角度为0°时，光控制单元控制使光束落在发光体的范围内 90°至120°的强度分布角为设备光通量的20％以上，并且使落入60°〜90°的发光强度分布角的范围内的光束为20％以下 设备光通量。

公开(公告)号：US20120242353A1

公开(公告)日：2012-09-27

申请号：US13489198

申请日：2012-06-05

申请人： Masaru Inoue ,  Kunihiko Sasaki ,  Takashi Kurihara ,  Yasuhiro Kume

发明人： Masaru Inoue ,  Kunihiko Sasaki ,  Takashi Kurihara ,  Yasuhiro Kume

IPC分类号： G01R27/26

CPC分类号： G02F1/1309 ,  G02F2001/136254 ,  G09G3/006 ,  G09G3/3648

摘要： There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

摘要翻译： 提供一种用于TFT液晶面板的物理性质测量方法，包括将TFT液晶面板的TFT的源极与漏极之间的阻抗设定为小于或等于预定值的阻抗设定步骤， 施加周期性变化的电压到TFT液晶面板的液晶层的电压施加步骤。 该方法还包括物理性能测量步骤，用于测量在电压施加步骤中施加循环变化的电压的流过液晶层的瞬态电流，以测量液晶层的物理性质。

公开(公告)号：US08047687B2

公开(公告)日：2011-11-01

申请号：US12757596

申请日：2010-04-09

申请人： Masaru Inoue ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Hirokazu Otake ,  Mitsuhiko Nishiie ,  Takuro Hiramatsu ,  Masatoshi Kumagai

发明人： Masaru Inoue ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Hirokazu Otake ,  Mitsuhiko Nishiie ,  Takuro Hiramatsu ,  Masatoshi Kumagai

IPC分类号： F21V17/12

CPC分类号： F21S8/026 ,  F21V7/0083 ,  F21V17/12 ,  F21V23/02 ,  F21V29/763 ,  F21Y2115/10

摘要： A lighting apparatus comprises a housing and a first reflector. The first reflector is mounted beneath the light source and includes a plurality of segmented reflectors, each having at its top, a installation hole and at its bottom, an opening wider than the installation hole. A second reflector is positioned beneath the first reflector. The height of the second reflector causes a first light shielding angle defined by a straight line passing through the installation hole and the bottom edge of the corresponding segmented reflector to be larger than a second light shielding angle defined by a straight line passing through the bottom edge of the segmented reflector and the bottom edge of the second reflector.

摘要翻译： 照明装置包括壳体和第一反射器。 第一反射器安装在光源下方，并且包括多个分段反射器，每个反射器在其顶部具有安装孔，并且在其底部具有比安装孔更宽的开口。 第二反射器位于第一反射器的下方。 第二反射器的高度导致由穿过安装孔和相应的分段反射器的底部边缘的直线限定的第一遮光角度大于由穿过底部边缘的直线限定的第二遮光角度 的分段反射器和第二反射器的底部边缘。

公开(公告)号：US07893707B2

公开(公告)日：2011-02-22

申请号：US12498844

申请日：2009-07-07

申请人： Masaru Inoue ,  Kunihiko Sasaki ,  Takashi Kurihara ,  Yasuhiro Kume

发明人： Masaru Inoue ,  Kunihiko Sasaki ,  Takashi Kurihara ,  Yasuhiro Kume

IPC分类号： G01R31/00

CPC分类号： G02F1/1309 ,  G02F2001/136254 ,  G09G3/006 ,  G09G3/3648

摘要： There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

摘要翻译： 提供一种用于TFT液晶面板的物理性质测量方法，包括将TFT液晶面板的TFT的源极与漏极之间的阻抗设定为小于或等于预定值的阻抗设定步骤， 施加周期性变化的电压到TFT液晶面板的液晶层的电压施加步骤。 该方法还包括物理性能测量步骤，用于测量在电压施加步骤中施加循环变化的电压的流过液晶层的瞬态电流，以测量液晶层的物理性质。

公开(公告)号：US07875831B2

公开(公告)日：2011-01-25

申请号：US12318945

申请日：2009-01-13

申请人： Masaru Inoue ,  Hiroshi Kawamata ,  Hironori Tanaka

发明人： Masaru Inoue ,  Hiroshi Kawamata ,  Hironori Tanaka

IPC分类号： G11B5/48 ,  G11B33/00

CPC分类号： B23K26/0738 ,  B21D11/20 ,  Y10T29/49041

摘要： Laser beam irradiation areas are provided in a load curve portion and an angle adjustment portion of a suspension. The laser beam irradiation areas are oriented in a direction in which the suspension is to be bent. A laser beam having a predetermined length and a predetermined shape is irradiated onto each laser beam irradiation area.

摘要翻译： 激光束照射区域设置在悬架的负载曲线部分和角度调节部分中。 激光束照射区域在悬架被弯曲的方向上取向。 具有预定长度和预定形状的激光束被照射到每个激光束照射区域上。

公开(公告)号：US20100195329A1

公开(公告)日：2010-08-05

申请号：US12757664

申请日：2010-04-09

申请人： Masaru Inoue ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Hirokazu Otake ,  Mitsuhiko Nishiie ,  Takuro Hiramatsu ,  Masatoshi Kumagai

发明人： Masaru Inoue ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Hirokazu Otake ,  Mitsuhiko Nishiie ,  Takuro Hiramatsu ,  Masatoshi Kumagai

IPC分类号： F21V1/00 ,  F21V29/00

CPC分类号： F21S8/026 ,  F21V7/0083 ,  F21V17/12 ,  F21V23/02 ,  F21V29/763 ,  F21Y2115/10

摘要： A lighting apparatus comprises a housing and a first reflector. The first reflector is mounted beneath the light source and includes a plurality of segmented reflectors, each having at its top, a installation hole and at its bottom, an opening wider than the installation hole. A second reflector is positioned beneath the first reflector. The height of the second reflector causes a first light shielding angle defined by a straight line passing through the installation hole and the bottom edge of the corresponding segmented reflector to be larger than a second light shielding angle defined by a straight line passing through the bottom edge of the segmented reflector and the bottom edge of the second reflector.

公开(公告)号：USD610289S1

公开(公告)日：2010-02-16

申请号：US29304250

申请日：2008-02-27

申请人： Masayuki Yoshinobu ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Masaru Inoue

设计人： Masayuki Yoshinobu ,  Keiichi Shimizu ,  Sumio Hashimoto ,  Masaru Inoue

公开(公告)号：US20080130751A1

公开(公告)日：2008-06-05

申请号：US11907701

申请日：2007-10-16

申请人： Takahiro Kobayakawa ,  Masaru Inoue ,  Akikazu Maehara

发明人： Takahiro Kobayakawa ,  Masaru Inoue ,  Akikazu Maehara

IPC分类号： H04N7/26

CPC分类号： H04N19/433 ,  H04N19/103 ,  H04N19/159 ,  H04N19/61

摘要： In encoding an interlace picture in a field picture, a motion-vector detecting apparatus changes over a reference picture of a P-picture in a field unit, and changes over a reference picture of a B-picture in a frame unit. Moreover, in detecting the motion vector in different predictive directions, the motion-vector detecting apparatus simultaneously carries out a process of the same reference picture by changing over original picture frames.

摘要翻译： 在场图像中对交错图像进行编码时，运动矢量检测装置以场单位切换P图像的参照图像，并以帧为单位切换B图像的参照图像。 此外，在检测不同预测方向上的运动矢量时，运动矢量检测装置通过改变原始图像帧来同时执行相同参考图像的处理。

公开(公告)号：US5209068A

公开(公告)日：1993-05-11

申请号：US819887

申请日：1992-01-13

申请人： Yoshiro Saji ,  Hiroaki Toda ,  Tetsuo Takagi ,  Takao Sugioka ,  Masaru Inoue ,  Kohei Otani ,  Manabu Sato

发明人： Yoshiro Saji ,  Hiroaki Toda ,  Tetsuo Takagi ,  Takao Sugioka ,  Masaru Inoue ,  Kohei Otani ,  Manabu Sato

IPC分类号： F25B21/00

CPC分类号： F25B21/00 ,  F25B2321/0021 ,  F25B2321/0023 ,  Y02B30/66 ,  Y10S505/891

摘要： A static magnetic refrigerator comprising a magnet generating a high-intensity magnetic field, a magnetic working material disposed in the high-intensity magnetic field, a magnetic shield disposed between the magnet and the magnetic working material, and a rotating means for rotating the magnetic shield, the magnetic shield comprising a pair of nearly parallel flat plates or a pair of outwardly curved plates facing each other and made of a superconductor, and the magnetic working material is accommodated in the inner space form by the pair of the flat or curved plates, whereby a magnetization process wherein the magnetic working material is magnetized in the high-intensity magnetic field by way of rotating the magnetic shield at a position allowing the permeation of the magnetic field through the magnetic working material via the pair of the flat or curved plates and a demagnetization process wherein the magnetic working material is demagnetized by way of further rotating the superconducting magnetic shield at another position permitting the shield of the magnetic field via the pair of the flat or curved plates are repeated by the rotating means so that the magnetic working material generates coldness.