公开(公告)号：US20210342705A1

公开(公告)日：2021-11-04

申请号：US17244087

申请日：2021-04-29

申请人： Maschinenfabrik Rieter AG

发明人： Selwyn von Grünigen ,  David Gehring ,  Nitin T. Patil

IPC分类号： G06N5/02 ,  G06N20/00 ,  D01H13/14

摘要： An electronic device and associated method are used to detect a fault in a spinning mill and to estimate one or more sources of the fault, the spinning mill including a plurality of textile machines that sequentially process textile materials. With the electronic device, the method receives parameter information of one or more of the textile machines and of one or more of the textile materials. The electronic device detects faults and location of the faults by identifying parameter information of the textile materials deviating from reference information. The electronic device is used to access configuration information of the textile machines and knowledge-based information related to possible sources of faults in the spinning mill. The method incudes using the electronic device to apply parameter information, configuration information, and knowledge-based information to one or more machine-learning algorithms to estimate the sources of the faults.