公开(公告)号：US20140154997A1

公开(公告)日：2014-06-05

申请号：US14054213

申请日：2013-10-15

Applicant: MediaTek Inc.

Inventor： Yen-Liang CHEN ,  Chun-Hsien PENG ,  Ying-Chou SHIH ,  Yu-An CHEN ,  Chun-Wei YANG

IPC: H04B17/00

CPC classification number: H04B17/0085 ,  H04B3/46 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.

Abstract translation: 提供集成电路（IC）。 IC包括：RF发射器，被配置为响应于来自测试设备的命令信号产生RF信号; RF接收器，被配置为根据RF信号生成评估信号，并将评估信号报告给测试设备，使得测试设备对评估信号进行测试分析以确定测试结果，其中测试设备是外部的 到IC。

公开(公告)号：US20160197685A1

公开(公告)日：2016-07-07

申请号：US15071513

申请日：2016-03-16

Applicant: MediaTek Inc.

Inventor： Chung-Chin TSAI ,  Chun-Hsien PENG

IPC: H04B17/17

CPC classification number: H04B17/17 ,  H04B17/0085 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes: an RF transmitter configured to generate an RF signal when the IC has entered a test mode; an RF receiver configured to receive the RF signal in the test mode; and a computation unit having a plurality of processing units that are parallelized to perform a test procedure of the IC according to the received RF signal to determine one or more test results.

Abstract translation: 提供集成电路（IC）。 IC包括：RF发射机，被配置为当IC进入测试模式时产生RF信号; RF接收器，被配置为在所述测试模式中接收所述RF信号; 以及计算单元，具有并行化的多个处理单元，以根据接收的RF信号执行IC的测试过程，以确定一个或多个测试结果。

公开(公告)号：US20160112148A1

公开(公告)日：2016-04-21

申请号：US14953673

申请日：2015-11-30

Applicant: MediaTek Inc.

Inventor： Jen-Yang LIU ,  I-Cheng TSAI ,  Hsueh-Wei CHIU ,  Yuan-Hwui CHUNG ,  Chun-Hsien PENG

IPC: H04B17/29 ,  H04B17/00

CPC classification number: H04B17/29 ,  H04B17/0085

Abstract: A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.

Abstract translation: 测试/校准系统包括被测设备（DUT）和校准设备。 校准的设备耦合到DUT，响应于用于测试，测量或校准DUT的内部部件的功能或性能的测试项目的控制信号，向DUT发送或接收来自DUT的测试信号。

公开(公告)号：US20150229415A1

公开(公告)日：2015-08-13

申请号：US14696807

申请日：2015-04-27

Applicant: MediaTek Inc.

Inventor： Yen-Liang CHEN ,  Chun-Hsien PENG ,  Ying-Chou SHIH ,  Yu-An CHEN ,  Chun-Wei YANG

IPC: H04B17/00 ,  H04B17/29

CPC classification number: H04B17/0085 ,  H04B3/46 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.

Abstract translation: 提供集成电路（IC）。 IC包括：RF发射器，被配置为响应于来自测试设备的命令信号产生RF信号; RF接收器，被配置为根据RF信号生成评估信号，并将评估信号报告给测试设备，使得测试设备对评估信号进行测试分析以确定测试结果，其中测试设备是外部的 到IC。

公开(公告)号：US20160204881A1

公开(公告)日：2016-07-14

申请号：US15074978

申请日：2016-03-18

Applicant: MediaTek Inc.

Inventor： Yuan-Hwui CHUNG ,  Chung-Chin TSAI ,  Ping-Hsuan TSU ,  Chun-Hsien PENG

IPC: H04B17/00

CPC classification number: H04B17/00 ,  G01R31/2822 ,  G01R31/31716 ,  H04B17/0085 ,  H04B17/19 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter and an RF receiver. The RF transmitter is configured to generate an RF signal in response to an analog test signal from a test signal generator of a module circuitry that is external to the IC. The RF receiver is configured to generate an outgoing signal according to an input RF signal, and to report the outgoing signal to the module circuitry. The module circuitry performs a test analysis on the RF signal generated by the RF transmitter or on the outgoing signal generated by the RF receiver to determine a test result. The test result is reported to a test equipment having no RF instruments.

Abstract translation: 提供集成电路（IC）。 IC包括RF发射器和RF接收器。 RF发射器被配置为响应于来自IC外部的模块电路的测试信号发生器的模拟测试信号而产生RF信号。 RF接收器被配置为根据输入RF信号产生输出信号，并将输出信号报告给模块电路。 模块电路对由RF发射器产生的RF信号或由RF接收器产生的输出信号执行测试分析以确定测试结果。 测试结果报告给没有RF仪器的测试设备。

公开(公告)号：US20160197684A1

公开(公告)日：2016-07-07

申请号：US15071536

申请日：2016-03-16

Applicant: MediaTek Inc.

Inventor： Chung-Chin TSAI ,  Chun-Hsien PENG ,  Yuan-Hwui CHUNG

IPC: H04B17/00 ,  H04B17/29

CPC classification number: H04B17/0085 ,  G01R31/2822 ,  G01R31/2856 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes: a controller, a serializer-deserializer (SerDes) device, a transmitter, and a receiver. The controller is configured to obtain a test signal when the IC has entered a test mode. The SerDes device is configured to perform a serialization/deserialization process on the test signal. The transmitter is configured to generate a radio frequency (RF) signal in response to the test signal after the serialization/deserialization process. The RF receiver is configured to receive the RF signal in the test mode. The controller further captures the received RF signal from the receiver for determining a test result.

Abstract translation: 提供集成电路（IC）。 IC包括：控制器，串行器 - 解串器（SerDes）设备，发射器和接收器。 控制器被配置为当IC进入测试模式时获得测试信号。 SerDes设备配置为对测试信号执行序列化/反序列化处理。 发射机被配置为在串行化/反序列化处理之后响应于测试信号产生射频（RF）信号。 RF接收器被配置为在测试模式下接收RF信号。 控制器进一步从接收器捕获接收到的RF信号，以确定测试结果。