公开(公告)号：US10361777B2

公开(公告)日：2019-07-23

申请号：US15820807

申请日：2017-11-22

Applicant: Mellanox Technologies, Ltd.

Inventor： Elad Mentovich ,  Itsik Kalifa ,  Kfir Margalit

IPC: H04B10/50 ,  H04B10/075

Abstract: A system for testing optical transmitters including a testing unit, a sensor board, one or more support rails, and a driver is provided. The testing board includes sockets that each receive a substrate supporting a plurality of optical transmitters, and the sensor board includes optical receivers. The one or more support rails are attached to one of the testing board or the sensor board and are designed to engage the other of the testing board or the sensor board. The one or more support rails are configured to substantially align each of the optical receivers with a corresponding socket. The driver is in electrical communication with the optical transmitters and the one or more optical receivers such that the driver can apply a current input to at least, one of the optical transmitters and monitor a corresponding output parameter.

公开(公告)号：US10270527B1

公开(公告)日：2019-04-23

申请号：US15820725

申请日：2017-11-22

Applicant: Mellanox Technologies, Ltd.

Inventor： Elad Mentovich ,  Itsik Kalifa ,  Kfir Margalit

IPC: H04B10/07 ,  H04B10/50 ,  H04B10/079

Abstract: Methods and associated computer program products for testing optical transmitters are provided. The method includes applying a first constant current input to at least one optical transmitter of a plurality of optical transmitters supported by a substrate where each substrate is received by a socket of a testing board. The method includes monitoring a first output voltage and a first operating temperature of the optical transmitter and includes determining a first voltage pass state or a first voltage fail state of the optical transmitter. The method also includes determining a first temperature pass state or a first temperature fail state of the optical transmitter. The method includes determining a first pass state for the optical transmitter in an instance in which the first voltage pass state and the first temperature pass state are determined.