公开(公告)号：US09568526B2

公开(公告)日：2017-02-14

申请号：US14025143

申请日：2013-09-12

Applicant: Microchip Technology Incorporated

Inventor： Andrew Voris ,  Burke Davison

IPC: G01R27/26 ,  G06F3/044 ,  H03K17/955

CPC classification number: G01R27/2605 ,  G06F3/044 ,  H03K17/955

Abstract: A system for reducing noise in a sensor measurement system includes a noise detector for detecting noise in capacitive to digital conversion measurements; a noise correction module operably coupled to the noise detector and configured to dynamically modify one or more delays associated with a sampling waveform; and a noise filter for filtering the sampling waveform.

Abstract translation: 一种用于降低传感器测量系统噪声的系统，包括用于检测电容式到数字转换测量中的噪声的噪声检测器; 噪声校正模块，其可操作地耦合到所述噪声检测器并且被配置为动态地修改与采样波形相关联的一个或多个延迟; 以及用于滤波采样波形的噪声滤波器。

公开(公告)号：US20140074436A1

公开(公告)日：2014-03-13

申请号：US14025143

申请日：2013-09-12

Applicant: Microchip Technology Incorporated

Inventor： Andrew Voris ,  Burke Davison

IPC: G01R27/26

CPC classification number: G01R27/2605 ,  G06F3/044 ,  H03K17/955

Abstract: A system for reducing noise in a sensor measurement system includes a noise detector for detecting noise in capacitive to digital conversion measurements; a noise correction module operably coupled to the noise detector and configured to dynamically modify one or more delays associated with a sampling waveform; and a noise filter for filtering the sampling waveform.

Abstract translation: 一种用于降低传感器测量系统噪声的系统，包括用于检测电容式到数字转换测量中的噪声的噪声检测器; 噪声校正模块，其可操作地耦合到所述噪声检测器并且被配置为动态地修改与采样波形相关联的一个或多个延迟; 以及用于滤波采样波形的噪声滤波器。