公开(公告)号：US20240168847A1

公开(公告)日：2024-05-23

申请号：US18507805

申请日：2023-11-13

Applicant: Micron Technology, Inc.

Inventor： Mustafa N. KAYNAK ,  Eyal EN GAD ,  Zhengang CHEN ,  Sivagnanam PARTHASARATHY ,  Phong Sy NGUYEN ,  Dung V. NGUYEN

IPC: G06F11/10 ,  G06F11/07

CPC classification number: G06F11/1068 ,  G06F11/076 ,  G06F11/1016

Abstract: A method includes performing a read operation of a first codeword including first hard data and generating an error vector using a reliability metric of the first hard data. The first hard data and error vector are stored in first and second portions of memory. A first corrected codeword is returned that combines the error vector and the hard data from the first and second portions of memory. A read operation of a second codeword is performed, including second hard data and soft information. The hard data and soft information are stored in the first and second portions of memory. A bit of second hard data is flipped responsive to comparing a reliability metric of the bit of the second hard data to a bit flipping threshold, wherein flipping the bit includes updating the second hard data. The updated second codeword is returned resulting from reading the portions of memory.