公开(公告)号：US20250094278A1

公开(公告)日：2025-03-20

申请号：US18778665

申请日：2024-07-19

Applicant: Micron Technology, Inc.

Inventor： Marco SFORZIN ,  Emanuele CONFALONIERI ,  Daniele BALLUCHI ,  Danilo CARACCIO ,  Nicola DEL GATTO ,  Rishabh DUBEY

IPC: G06F11/10

Abstract: Provided in a central controller system, is a system and method to identify and mitigate errors on a die containing mission critical logical-to-physical addressing information. The logical-to-physical (L2P) addressing information is essential for translating logical memory addresses for uncompressed data to physical addresses for compressed data. When a die containing L2P data is detected as being corrupted, the corrupted data is corrected, and all the data is moved to an uncorrupted die at a specified offset from the original address of the die.