公开(公告)号：US20220100427A1

公开(公告)日：2022-03-31

申请号：US17464333

申请日：2021-09-01

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Scheafer ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.