公开(公告)号：US11984184B2

公开(公告)日：2024-05-14

申请号：US17873869

申请日：2022-07-26

Applicant: Micron Technology, Inc.

Inventor： Subhasis Sasmal ,  Dong Pan

IPC: G11C29/50 ,  G01R19/165 ,  G11C29/12

CPC classification number: G11C29/50004 ,  G01R19/16528 ,  G01R19/16533 ,  G11C29/12005 ,  G11C2029/5004

Abstract: An electronic device, such as a memory device, may include various circuit components. The electronic device may also include one or more voltage testing circuits to determine whether signals of one or more of the circuit components are within acceptable voltage ranges of the respective circuit components. Systems and methods are described to improve correct voltage measurement of the received signals by a voltage testing circuit. In particular, multiple supply voltage levels are provided to different components of the voltage testing circuit to provide a sufficient headroom voltage gap between received signals and the supply voltages. For example, some active circuits (e.g., operational amplifiers) of the voltage testing circuit may receive a higher supply voltage of the electronic device compared to one or more other circuits of the voltage testing circuit.

公开(公告)号：US20240038321A1

公开(公告)日：2024-02-01

申请号：US17873869

申请日：2022-07-26

Applicant: Micron Technology, Inc.

Inventor： Subhasis Sasmal ,  Dong Pan

IPC: G11C29/50 ,  G11C29/12 ,  G01R19/165

CPC classification number: G11C29/50004 ,  G11C29/12005 ,  G01R19/16528 ,  G01R19/16533 ,  G11C2029/5004

Abstract: An electronic device, such as a memory device, may include various circuit components. The electronic device may also include one or more voltage testing circuits to determine whether signals of one or more of the circuit components are within acceptable voltage ranges of the respective circuit components. Systems and methods are described to improve correct voltage measurement of the received signals by a voltage testing circuit. In particular, multiple supply voltage levels are provided to different components of the voltage testing circuit to provide a sufficient headroom voltage gap between received signals and the supply voltages. For example, some active circuits (e.g., operational amplifiers) of the voltage testing circuit may receive a higher supply voltage of the electronic device compared to one or more other circuits of the voltage testing circuit.