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1.发明申请公开(公告)号：US20230128736A1
公开(公告)日：2023-04-27
申请号：US17699473
申请日：2022-03-21
Applicant: Ming Chi University of Technology
Inventor： Jang-Hsing HSIEH , Yi-Jin WEI
Abstract: A method for testing a light-emitting diode (LED) includes steps of providing a plasma generating device in proximity to a device under test (DUT) that includes the LED and a conductive port which are electrically connected to each other, and utilizing the plasma generating device to emit a plasma beam toward the conductive port of the DUT to cause generation of a positive voltage on the LED for testing the LED.
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