Cryogenic analysis systems and methods

    公开(公告)号:US11959845B1

    公开(公告)日:2024-04-16

    申请号:US17698764

    申请日:2022-03-18

    IPC分类号: G01N1/42 G01N25/14

    CPC分类号: G01N1/42 G01N25/145

    摘要: Cryogenic device analysis systems are provided that can include: a cold source within a first vacuum chamber; a cryogenic device mount within a second vacuum chamber, wherein the first and second vacuum chambers are separated by a vacuum barrier; a first thermal conduit extending from the cold source through the vacuum barrier to the sample mount; a first thermal switch along the first thermal conduit and operatively aligned between the cold source and the vacuum barrier. Methods for performing analysis of a cryogenic device are also provided.

    Cryogenic Analysis Systems and Methods
    2.
    发明公开

    公开(公告)号:US20240192099A1

    公开(公告)日:2024-06-13

    申请号:US18582621

    申请日:2024-02-20

    IPC分类号: G01N1/42 G01N25/14

    CPC分类号: G01N1/42 G01N25/145

    摘要: Cryogenic device analysis systems are provided that can include: a cold source within a first vacuum chamber; a cryogenic device mount within a second vacuum chamber, wherein the first and second vacuum chambers are separated by a vacuum barrier; a first thermal conduit extending from the cold source through the vacuum barrier to the sample mount; a first thermal switch along the first thermal conduit and operatively aligned between the cold source and the vacuum barrier. Methods for performing analysis of a cryogenic device are also provided.