公开(公告)号：US09759665B2

公开(公告)日：2017-09-12

申请号：US14712205

申请日：2015-05-14

申请人： Myoung-ki Ahn ,  Jin-woo Ahn ,  Tae-yong Jo ,  Hyeong-min Ahn ,  Tae-hyoung Lee

发明人： Myoung-ki Ahn ,  Jin-woo Ahn ,  Tae-yong Jo ,  Hyeong-min Ahn ,  Tae-hyoung Lee

IPC分类号： G01N21/00 ,  G01N21/88 ,  G01N21/95

CPC分类号： G01N21/8806 ,  G01N21/95 ,  G01N2021/9513

摘要： A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.