DC resistance measurement contact checking via alternating current high frequency injection

    公开(公告)号:US11994545B2

    公开(公告)日:2024-05-28

    申请号:US17728377

    申请日:2022-04-25

    CPC classification number: G01R27/16 G01R31/31924

    Abstract: A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.

    DC Resistance Measurement Contact Checking via Alternating Current High Frequency Injection

    公开(公告)号:US20220365123A1

    公开(公告)日:2022-11-17

    申请号:US17728377

    申请日:2022-04-25

    Abstract: A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.

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