APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION METHOD, AND APPEARANCE INSPECTION PROGRAM

    公开(公告)号:US20240289941A1

    公开(公告)日:2024-08-29

    申请号:US17768612

    申请日:2020-10-05

    CPC classification number: G06T7/0008 G06T7/62 G06T2207/30156 G06T2207/30204

    Abstract: A conversion equation calculation unit 81 calculates, based on a defect image with marker in which a marker of a predetermined size that can be recognized regardless of color of appearance of an object to be inspected and a defect of the object to be inspected are taken, a conversion equation from size of the defect image with marker to actual size. A defect type determination unit 82 determines, by using a model for detecting the defect of the object to be inspected from an image and determining a defect type, the defect type included in the defect image with marker. A defect measuring unit 83 measures defect size included in the defect image with marker by using the conversion equation. A defect content output unit 84 outputs the determined defect type and the measured defect size.

    DEFECT POSITION DETERMINATION SYSTEM, APPEARANCE INSPECTION METHOD AND PROGRAM

    公开(公告)号:US20220392057A1

    公开(公告)日:2022-12-08

    申请号:US17770109

    申请日:2020-10-05

    Abstract: A first imaging unit 71 generates a first image a first image by taking an object to be inspected. A guide display unit 72 determines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unit 73 generates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unit 74 determines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unit 75 collects defect information associated with a type of the object to be inspected and the position of the defect.

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