公开(公告)号：US20240289941A1

公开(公告)日：2024-08-29

申请号：US17768612

申请日：2020-10-05

Applicant: NEC Corporation

Inventor： Yuka OSHIMA ,  Takuroh KASHIMA ,  Yusuke KOITABASHI ,  Atsushi MATSUDA

IPC: G06T7/00 ,  G06T7/62

CPC classification number: G06T7/0008 ,  G06T7/62 ,  G06T2207/30156 ,  G06T2207/30204

Abstract: A conversion equation calculation unit 81 calculates, based on a defect image with marker in which a marker of a predetermined size that can be recognized regardless of color of appearance of an object to be inspected and a defect of the object to be inspected are taken, a conversion equation from size of the defect image with marker to actual size. A defect type determination unit 82 determines, by using a model for detecting the defect of the object to be inspected from an image and determining a defect type, the defect type included in the defect image with marker. A defect measuring unit 83 measures defect size included in the defect image with marker by using the conversion equation. A defect content output unit 84 outputs the determined defect type and the measured defect size.

公开(公告)号：US20220392057A1

公开(公告)日：2022-12-08

申请号：US17770109

申请日：2020-10-05

Applicant: NEC Corporation

Inventor： Yuka OSHIMA ,  Takuroh KASHIMA ,  Yusuke KOITABASHI ,  Atsushi MATSUDA

IPC: G06T7/00 ,  G06T7/70 ,  G01N21/88

Abstract: A first imaging unit 71 generates a first image a first image by taking an object to be inspected. A guide display unit 72 determines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unit 73 generates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unit 74 determines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unit 75 collects defect information associated with a type of the object to be inspected and the position of the defect.

公开(公告)号：US20250045897A1

公开(公告)日：2025-02-06

申请号：US18717557

申请日：2021-12-24

Applicant: NEC CORPORATION

Inventor： Shigeki IKOMA ,  Yuka OSHIMA

IPC: G06T7/00 ,  G01M17/02 ,  G06V10/46

Abstract: A tire inspection support apparatus includes: a first detection unit that detects a first area including a cracked part candidate in a tire through first image processing performed on a photographed image of the tire; a generation unit that generates an image to be processed obtained by extracting a partial image corresponding to the first area from the photographed image; a second detection unit that detects a second area showing the cracked part from the first area through second image processing performed on the image to be processed; and a calculation unit that calculates an index value for the cracked part in the tire based on the second area.