公开(公告)号：US20210287356A1

公开(公告)日：2021-09-16

申请号：US17193136

申请日：2021-03-05

Applicant: NEC Corporation

Inventor： Shigeo Suzuki ,  Taisuke Tanabe ,  Hiroshi Matsumoto ,  Takanori Shigeta ,  Junichi Abe ,  Akira Tsuji ,  Yoshimasa Ono ,  Jiro Abe

IPC: G06T7/00 ,  G01S17/42 ,  G01S17/86

Abstract: An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatus 11 according to the present disclosure includes an acquisition unit 111 configured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus 12, and a photograph image of the object obtained by photographing the object by using a photographing apparatus 13, a display unit 112 configured to display the point group data and the photograph image on a predetermined screen, and a control unit 113 configured to control the point group data and the photograph image to be displayed in the display unit 112.

公开(公告)号：US12222293B2

公开(公告)日：2025-02-11

申请号：US17912950

申请日：2020-03-31

Applicant: NEC Corporation

Inventor： Akira Tsuji ,  Junichi Abe ,  Taisuke Tanabe

IPC: G01N21/88 ,  G06T7/13 ,  G06V10/60 ,  G06V10/764

Abstract: A detection device (20) according to the present disclosure includes an acquisition unit (11) that acquires point cloud data indicating a distance to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit (12) that performs edge detection based on the luminance information, a classification unit (21) that classifies, based on distribution of points contained in a crack candidate being a set of points detected as an edge, a plurality of the crack candidates into one of groups, and a label assignment unit (23) that accepts input of a label regarding the group from a user having visually recognized a shape of the crack candidate belonging to the group.

公开(公告)号：US11869179B2

公开(公告)日：2024-01-09

申请号：US17193136

申请日：2021-03-05

Applicant: NEC Corporation

Inventor： Shigeo Suzuki ,  Taisuke Tanabe ,  Hiroshi Matsumoto ,  Takanori Shigeta ,  Junichi Abe ,  Akira Tsuji ,  Yoshimasa Ono ,  Jiro Abe

IPC: G06T7/00 ,  G01S17/86 ,  G01S17/42

CPC classification number: G06T7/0004 ,  G01S17/42 ,  G01S17/86 ,  G06T2207/30108

Abstract: An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatus 11 according to the present disclosure includes an acquisition unit 111 configured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus 12, and a photograph image of the object obtained by photographing the object by using a photographing apparatus 13, a display unit 112 configured to display the point group data and the photograph image on a predetermined screen, and a control unit 113 configured to control the point group data and the photograph image to be displayed in the display unit 112.