CONDUCTIVE PROBE FOR INSPECTION AND SEMICONDUCTOR INSPECTION DEVICE

    公开(公告)号:US20180238932A1

    公开(公告)日:2018-08-23

    申请号:US15576605

    申请日:2017-02-01

    CPC classification number: G01R1/06738 G01R1/067 G01R31/2601

    Abstract: Provided is a conductive probe having a first end portion and a second end portion opposing the first end portion. The first end portion includes first to fourth linear ridges and first to fifth vertexes, and the first to fourth linear ridges are spaced from one another and arranged to form a cross. The first to fourth vertexes are located on an outer circumference of the first end portion and further arranged between the first linear ridge and the second linear ridge, between the second linear ridge and the third linear ridge, between the third linear ridge and the fourth linear ridge, and between the fourth linear ridge and the first linear ridge, respectively.

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