公开(公告)号：US11659986B2

公开(公告)日：2023-05-30

申请号：US17016931

申请日：2020-09-10

Applicant: NIDEK CO., LTD.

Inventor： Shirohisa Kobayashi ,  Kunio Suzuki ,  Hiroyoshi Nakanishi ,  Kazunari Shimizu

IPC: A61B3/00 ,  A61B3/10 ,  A61B3/15 ,  A61B3/16

CPC classification number: A61B3/0058 ,  A61B3/005 ,  A61B3/102 ,  A61B3/1025 ,  A61B3/152 ,  A61B3/16

Abstract: Provided is an ophthalmic apparatus for examining an examinee's eye, including: an examination device configured to examine the examinee's eye; an approacher in the examination device, configured to approach the examinee; a detector configured to detect approach of the approacher to the examinee; and a controller configured to switch an operation mode between a first mode where an avoidance operation for avoiding the approach is performed and a second mode where the avoidance operation is not performed, upon the detector detecting the approach.