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    INFRARED SECURITY SYSTEM
    4.
    发明公开
    INFRARED SECURITY SYSTEM 审中-公开

    公开(公告)号：US20240346869A1

    公开(公告)日：2024-10-17

    申请号：US18293069

    申请日：2022-03-29

    Applicant: NITTO DENKO CORPORATION

    Inventor： Mami KAWAGUCHI ,  Yudai NUMATA ,  Shoichi MATSUDA ,  Ryu YAMAMOTO

    IPC: G07C9/29 ,  G06K7/12

    CPC classification number: G07C9/29 ,  G06K7/12

    Abstract: The present invention strengthens the security level of an infrared security system. The infrared security system for managing unlocking of a lock includes: at least one detection unit that includes an optical laminate and an infrared detection device which is disposed so as to receive infrared light via the optical laminate; and a security system that operates on the basis of output from the infrared detection device. The security system is configured to generate time-series data that indicates motion of a subject on the basis of a subject signal generated when the infrared detection device receives, via the optical laminate, infrared light which has been emitted from a light-emitting device toward the subject and which has been reflected by the subject, and to unlock the lock on the basis of the time-series data.

    OPTICAL MULTILAYER BODY AND SYSTEM
    5.
    发明申请
    OPTICAL MULTILAYER BODY AND SYSTEM 有权

    公开(公告)号：US20250094752A1

    公开(公告)日：2025-03-20

    申请号：US18707465

    申请日：2022-10-25

    Applicant: NITTO DENKO CORPORATION

    Inventor： Mami KAWAGUCHI ,  Yudai NUMATA ,  Shoichi MATSUDA ,  Naoki SATO

    IPC: G06K19/06 ,  G06K7/10

    Abstract: An optical multilayer body (100) according to the present invention has a first main surface and a second main surface that is on the reverse side of the first main surface. This optical multilayer body (100) comprises: an optical filter layer (110) which transmits infrared light, while diffusely reflecting visible light; and a recording medium layer (120) which is arranged on the second main surface side of the optical filter layer, while having a pattern that can be read with infrared light through the optical filter layer. This optical multilayer body is configured such that the pattern is not visible through the optical filter layer.

    OPTICAL FILTER, METHOD FOR MANUFACTURING SAME, AND OPTICAL MODULE
    6.
    发明申请
    OPTICAL FILTER, METHOD FOR MANUFACTURING SAME, AND OPTICAL MODULE 有权

    公开(公告)号：US20230119681A1

    公开(公告)日：2023-04-20

    申请号：US17911915

    申请日：2021-03-15

    Applicant: NITTO DENKO CORPORATION

    Inventor： Masato KATSUDA ,  Yudai NUMATA ,  Shoichi MATSUDA

    IPC: G02B5/20

    Abstract: Disclosed is an optical filter with L* measured by the SCE method being 20 or greater, wherein: the linear transmittance with respect to light with wavelengths being at least a portion of a wavelength range from 760 nm to 2000 nm is 60% or greater; and, before and after a light resistance test wherein light of a xenon arc lamp (average integrated illuminance of light with wavelengths from 300 nm to 400 nm:120 W/m2) is shone for 300 hours, the absolute value of a change in C* measured by the SCE method using a spectroscopic colorimeter is 6 or less.

    OPTICAL FILTER, METHOD OF PRODUCING SAME, AND OPTICAL MODULE
    7.
    发明申请
    OPTICAL FILTER, METHOD OF PRODUCING SAME, AND OPTICAL MODULE 有权

    公开(公告)号：US20230116255A1

    公开(公告)日：2023-04-13

    申请号：US17911875

    申请日：2021-03-15

    Applicant: NITTO DENKO CORPORATION

    Inventor： Yudai NUMATA ,  Masato KATSUDA ,  Shoichi MATSUDA

    IPC: G02B5/26 ,  G02B5/20 ,  G02B5/02

    Abstract: This optical filter has a back-scattering property, and the linear transmittance thereof to light of at least some wavelengths in the wavelength range of 760-2000 nm is 60% or higher. Where: the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 0° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (0°; 20°, −60°); the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 30° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (30°; 20°, −60°); and the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 60° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (60°; 20°, −60°), then, for the incident light having at least some wavelengths in the wavelength range of visible light, |BRDF (0°; 20°, −60°)−BRDF (30°; 20°, −60°)|/BRDF (0°; 20°, −60°) is 1.0 or lower, and |BRDF (0°; 20°, −60°)−BRDF (60°; 20°, −-60°)|/BRDF (0°; 20°, −60°) is 1.0 or lower.

    OPTICAL FILTER, METHOD FOR MANUFACTURING SAME, AND OPTICAL MODULE
    8.
    发明公开
    OPTICAL FILTER, METHOD FOR MANUFACTURING SAME, AND OPTICAL MODULE 审中-公开

    公开(公告)号：US20240168208A1

    公开(公告)日：2024-05-23

    申请号：US18417345

    申请日：2024-01-19

    Applicant: NITTO DENKO CORPORATION

    Inventor： Masato KATSUDA ,  Yudai NUMATA ,  Shoichi MATSUDA

    IPC: G02B5/20

    CPC classification number: G02B5/206 ,  G02B5/208

    Abstract: An optical filter is configured to have a regular transmittance of 60% of higher for light having a wavelength of 950 nm. The optical filter is also configured such that in a state in which a light resistance test of irradiating the optical filter for 300 hours with light from a xenon arc lamp having a wavelength not shorter than 300 nm and not longer than 400 nm and a wattage of 120 W/m2 is performed, the optical filter exhibits a change in C* having an absolute value of 6 or smaller between before and after the light resistance test, the C* being measured by the SCE method by use of a spectrophotometer.

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