公开(公告)号：US20200381610A1

公开(公告)日：2020-12-03

申请号：US16497969

申请日：2018-03-08

Applicant: NITTO DENKO CORPORATION

Inventor： Masaharu ARIMOTO ,  Hironobu MACHINAGA ,  Masato KATSUDA ,  Manami KUROSE

IPC: H01L41/08 ,  H01L41/047 ,  H01L41/113 ,  H01L41/187 ,  H01L41/316 ,  H01L41/319

Abstract: A piezoelectric device has a layered structure in which at least a first electrode, a plastic layer, an orientation control layer, a piezoelectric layer, and a second electrode are stacked, wherein the orientation control layer is amorphous, and the piezoelectric layer with a thickness of 20 nm to 250 nm is provided over the orientation control layer, the piezoelectric layer having a wurtzite crystal structure, and wherein the orientation control layer and the piezoelectric layer are provided between the first electrode and the second electrode.

公开(公告)号：US20240168208A1

公开(公告)日：2024-05-23

申请号：US18417345

申请日：2024-01-19

Applicant: NITTO DENKO CORPORATION

Inventor： Masato KATSUDA ,  Yudai NUMATA ,  Shoichi MATSUDA

IPC: G02B5/20

CPC classification number: G02B5/206 ,  G02B5/208

Abstract: An optical filter is configured to have a regular transmittance of 60% of higher for light having a wavelength of 950 nm. The optical filter is also configured such that in a state in which a light resistance test of irradiating the optical filter for 300 hours with light from a xenon arc lamp having a wavelength not shorter than 300 nm and not longer than 400 nm and a wattage of 120 W/m2 is performed, the optical filter exhibits a change in C* having an absolute value of 6 or smaller between before and after the light resistance test, the C* being measured by the SCE method by use of a spectrophotometer.

公开(公告)号：US20230117522A1

公开(公告)日：2023-04-20

申请号：US17911889

申请日：2021-03-15

Applicant: NITTO DENKO CORPORATION

Inventor： Yudai NUMATA ,  Masato KATSUDA ,  Shoichi MATSUDA

IPC: G02B5/20

Abstract: This optical filter 10 has an L* of at least 20 as measured by the SCE method, wherein the linear transmittance is at least 60% with respect to light the wavelength of which falls at least partially within the wavelength range of 760 nm-2,000 nm, and the temperature, at which the optical filter contracts by being heated, is at least 85° C.

公开(公告)号：US20230119681A1

公开(公告)日：2023-04-20

申请号：US17911915

申请日：2021-03-15

Applicant: NITTO DENKO CORPORATION

Inventor： Masato KATSUDA ,  Yudai NUMATA ,  Shoichi MATSUDA

IPC: G02B5/20

Abstract: Disclosed is an optical filter with L* measured by the SCE method being 20 or greater, wherein: the linear transmittance with respect to light with wavelengths being at least a portion of a wavelength range from 760 nm to 2000 nm is 60% or greater; and, before and after a light resistance test wherein light of a xenon arc lamp (average integrated illuminance of light with wavelengths from 300 nm to 400 nm:120 W/m2) is shone for 300 hours, the absolute value of a change in C* measured by the SCE method using a spectroscopic colorimeter is 6 or less.

公开(公告)号：US20230116255A1

公开(公告)日：2023-04-13

申请号：US17911875

申请日：2021-03-15

Applicant: NITTO DENKO CORPORATION

Inventor： Yudai NUMATA ,  Masato KATSUDA ,  Shoichi MATSUDA

IPC: G02B5/26 ,  G02B5/20 ,  G02B5/02

Abstract: This optical filter has a back-scattering property, and the linear transmittance thereof to light of at least some wavelengths in the wavelength range of 760-2000 nm is 60% or higher. Where: the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 0° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (0°; 20°, −60°); the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 30° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (30°; 20°, −60°); and the azimuth from an incidence plane when the polar angle of the direction of incidence of incident light is 60° is 20°, and the value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (60°; 20°, −60°), then, for the incident light having at least some wavelengths in the wavelength range of visible light, |BRDF (0°; 20°, −60°)−BRDF (30°; 20°, −60°)|/BRDF (0°; 20°, −60°) is 1.0 or lower, and |BRDF (0°; 20°, −60°)−BRDF (60°; 20°, −-60°)|/BRDF (0°; 20°, −60°) is 1.0 or lower.

公开(公告)号：US20240151886A1

公开(公告)日：2024-05-09

申请号：US18417316

申请日：2024-01-19

Applicant: NITTO DENKO CORPORATION

Inventor： Yudai NUMATA ,  Masato KATSUDA ,  Shoichi MATSUDA

IPC: G02B5/20

CPC classification number: G02B5/206 ,  G02B5/208

Abstract: An optical filter is configured to have a regular transmittance of 60% or higher for light having a wavelength of 950 nm. The optical filter is also configured to be contracted by being heated at a temperature of 85° C. or higher, or a size change of the optical filter occurs from room temperature to 300° C. as monotonous increase in a tensile mode of a thermomechanical analyzer (TMA).

公开(公告)号：US20230129841A1

公开(公告)日：2023-04-27

申请号：US17911902

申请日：2021-03-15

Applicant: NITTO DENKO CORPORATION

Inventor： Tomoya MATSUDA ,  Yudai NUMATA ,  Masato KATSUDA ,  Shoichi MATSUDA

IPC: G02B5/20 ,  G02B5/02

Abstract: An optical filter (10) comprises a matrix (12) and fine particles (14) dispersed in the matrix (12), wherein the fine particles (14) have a parameter Ds of 8.0 to 30 inclusive, Ds being determined by a USAXS pattern and given by Ds=λ/(B·cos θ·Ra), where λ is the X-ray wavelength, θ is one half the scattering angle 2θ(rad) providing a scattering intensity peak, B is the half width (FWHM, rad) of the peak, and Ra is the average particle size of the fine particles (14).